MPC8536E-ANDROID Freescale Semiconductor, MPC8536E-ANDROID Datasheet - Page 1588

• Manufacturer Part Number: MPC8536E-ANDROID
• Description: HARDWARE/SOFTWARE ANDROID OS
• Manufacturer: Freescale Semiconductor
• Series: PowerQUICC ™r
• Type: MPUr

Specifications of MPC8536E-ANDROID

• Contents: Board
• For Use With/related Products: MPC8536
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

1
Debug Features and Watchpoint Facility
25.2.2
This section describes the details of the debug, watchpoint monitor, and JTAG test signals
25.2.2.1
Table 25-3
25-6
While these signals are normally bidirectional, when sourcing debug information they are output only.
THERM[0:1]
L1_TSTCLK
L2_TSTCLK
TEST_SEL
LSSD_
MODE
Name
TRST
TDO
TMS
MDVAL
Signal
TDI
describes all signals associated with device debug modes.
Detailed Signal Descriptions
Debug Signals—Details
Description
Test select 1
Test mode
Test reset
Test data
Test data
Thermal
I/O
resistor
access
O Memory data-valid. Indicates when valid data is available. May be used by a logic analyzer to
output
select
input
Table 25-2. Debug, Watchpoint and Test Signal Summary (continued)
Test
Test
Test
MPC8536E PowerQUICC III Integrated Processor Reference Manual, Rev. 1
capture the data on the data bus.
Meaning
Table 25-3. Debug Signals—Detailed Signal Descriptions
Timing Asserted/Negated—Referenced to the selected interface, (DDR or local bus).
State
Functional
Debug
Debug
Debug
Debug
Block
Asserted—Indicates that data is valid on the data bus during the current clock cycle.
Test
Test
Test
Test
Test
When the DDR SDRAM interface is selected to source information on MDVAL,
this signal is valid for every cycle that data is driven or received on the DDR
SDRAM interface. When the LBC is selected, this signal is valid for every cycle
that data is driven or received on the local bus interface. The assertion of this
signal may be used by a logic analyzer to capture data.
Asserts when data is valid. Assertions are held for the duration of the transfer.
Read data timing is similar to MA. Write data timing is similar to the output
MDQ.
Serial input for instructions and data to the JTAG test
subsystem. Internally pulled up.
Serial data output for the JTAG test subsystem. High
impedance except when scanning out data.
Carries commands to the TAP controller for boundary scan
operations. Internally pulled up.
Resets the TAP controller asynchronously.
These pins tie directly to an internal resistor whose value
varies linearly with temperature.
Factory test. Must be negated (pulled high) for normal
operation.
Factory Test. Refer to the MPC8536E Integrated Processor
Hardware Specifications for proper treatment.
Factory Test. Refer to the MPC8536E Integrated Processor
Hardware Specifications for proper treatment.
Factory Test. Refer to the MPC8536E Integrated Processor
Hardware Specifications for proper treatment.
Description
Function
Freescale Semiconductor
Reset
Value
Hi Z
—
—
—
1
1
I/O Page #
O
I
I
I
I
I
I
I
I
25-8
25-8
25-8
25-8
25-8
25-8
25-8
25-8
25-8