MK30DN512ZVLK10 Freescale Semiconductor, MK30DN512ZVLK10 Datasheet - Page 498

• Manufacturer Part Number: MK30DN512ZVLK10
• Description: ARM Microcontrollers - MCU KINETIS 512K SLCD
• Manufacturer: Freescale Semiconductor

Specifications of MK30DN512ZVLK10

• Core: ARM Cortex M4
• Processor Series: K30
• Data Bus Width: 32 bit
• Maximum Clock Frequency: 50 MHz
• Program Memory Size: 512 KB
• Data Ram Size: 128 KB
• On-chip Adc: Yes
• Operating Supply Voltage: 1.71 V to 3.6 V
• Operating Temperature Range: - 40 C to + 105 C
• Package / Case: LQFP-80
• Mounting Style: SMD/SMT

Memory Map and Register Definition
23.7.1 Watchdog Status and Control Register High
Address: WDOG_STCTRLH is 4005_2000h base + 0h offset = 4005_2000h
498
Reset
Read
Write
DISTESTWDOG
4005_2014
4005_2016
BYTESEL[1:0]
Absolute
TESTWDOG
address
Bit
TESTSEL
Reserved
(hex)
13–12
Field
15
14
11
10
15
0
0
(WDOG_STCTRLH)
Watchdog Reset Count Register (WDOG_RSTCNT)
Watchdog Prescaler Register (WDOG_PRESC)
14
0
This read-only field is reserved and always has the value zero.
Allows the WDOG’s functional test mode to be disabled permanently. Once set, it can only be cleared by
a reset. It cannot be unlocked for editing once it is set.
0
1
This 2-bit field select the byte to be tested when the watchdog is in the byte test mode.
00
01
10
11
Selects the test to be run on the watchdog timer. Effective only if TESTWDOG is set.
0
1
Puts the watchdog in the functional test mode. In this mode the watchdog timer and the associated
compare and reset generation logic is tested for correct operation. The clock for the timer is switched from
the main watchdog clock to the fast clock input for watchdog functional test. The TESTSEL bit selects the
test to be run.
WDOG functional test mode is not disabled.
WDOG functional test mode is disabled permanently until reset.
Quick test. The timer runs in normal operation. You can load a small time-out value to do a quick test.
Byte test. Puts the timer in the byte test mode where individual bytes of the timer are enabled for
operation and are compared for time-out against the corresponding byte of the programmed time-out
value. Select the byte through BYTESEL[1:0] for testing.
13
Byte 0 selected
Byte 1 selected
Byte 2 selected
Byte 3 selected
0
K30 Sub-Family Reference Manual, Rev. 6, Nov 2011
12
0
WDOG_STCTRLH field descriptions
Register name
WDOG memory map (continued)
11
0
Table continues on the next page...
10
0
0
0
9
1
8
Description
1
7
1
6
(in bits)
Width
16
16
0
5
Access
R/W
R/W
1
4
Freescale Semiconductor, Inc.
Reset value
0
3
0000h
0400h
0
2
1
1
Section/
23.7.11/
23.7.12/
page
504
504
1
0