MC56F8257MLH Freescale Semiconductor, MC56F8257MLH Datasheet - Page 621

DSC 64K FLASH 60MHZ 64-LQFP

MC56F8257MLH

Manufacturer Part Number
MC56F8257MLH
Description
DSC 64K FLASH 60MHZ 64-LQFP
Manufacturer
Freescale Semiconductor
Series
56F8xxxr

Specifications of MC56F8257MLH

Core Processor
56800E
Core Size
16-Bit
Speed
60MHz
Connectivity
CAN, I²C, LIN, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
54
Program Memory Size
64KB (32K x 16)
Program Memory Type
FLASH
Ram Size
4K x 16
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Data Converters
A/D 16x12b, D/A 1x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 105°C
Package / Case
64-LQFP
Product
DSCs
Processor Series
56800E
Core
56800E
Device Million Instructions Per Second
60 MIPs
Maximum Clock Frequency
60 MHz
Number Of Programmable I/os
54
Data Ram Size
8 KB
Operating Supply Voltage
3.3 V
Maximum Operating Temperature
+ 105 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
12 bit, 8 Channel
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

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Chapter 21
Joint Test Action Group (JTAG) Port
21.1 Introduction
Because this device also has a DSC core containing its own test access port (TAP), or
core TAP, a TAP linking module (TLM) is included to manage the TAP access. Normal
operation of this device uses the device TAP as the master TAP controller, thereby
disabling the core TAPcontroller. This chapter discusses the master TAP only.
21.1.1 Features
TAP characteristics include:
Freescale Semiconductor
• Access the EOnCE module controller and circuits to control a target system.
• Query the IDCODE from any TAP in the system.
• Force test data onto the peripheral outputs while replacing its Boundary Scan
• Enable/Disable pullup devices on peripheral boundary scan pins.
Register (BSR) with a single bit register.
MC56F825x/4x Reference Manual, Rev. 2, 10/2010
Preliminary
621

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