AT32UC3A364-ALUT Atmel, AT32UC3A364-ALUT Datasheet - Page 950

• Manufacturer Part Number: AT32UC3A364-ALUT
• Description: IC MCU 64KB FLASH 144LQFP
• Manufacturer: Atmel
• Series: AVR®32 UC3r

Specifications of AT32UC3A364-ALUT

• Core Processor: AVR
• Core Size: 32-Bit
• Speed: 66MHz
• Connectivity: EBI/EMI, I²C, IrDA, MMC, SPI, SSC, UART/USART, USB OTG
• Peripherals: Brown-out Detect/Reset, DMA, POR, WDT
• Number Of I /o: 110
• Program Memory Size: 64KB (64K x 8)
• Program Memory Type: FLASH
• Ram Size: 128K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 144-LQFP
• Processor Series: AT32UC3x
• Core: AVR32
• Data Bus Width: 32 bit
• Data Ram Size: 96 KB
• Interface Type: IrDA/SCI/SCIF/UDI
• Maximum Clock Frequency: 66 MHz
• Number Of Timers: 3
• Operating Supply Voltage: 3 V to 3.6 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWAVR32, EWAVR32-BL, KSK-EVK1100-PL
• Development Tools By Supplier: ATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATAVRONEKIT, ATEXTWIFI, ATEVK1104
• Minimum Operating Temperature: - 40 C
• Controller Family/series: AT32UC3A
• No. Of I/o's: 110
• Ram Memory Size: 64KB
• Cpu Speed: 66MHz
• No. Of Timers: 2
• Rohs Compliant: Yes
• For Use With: ATEVK1104 - KIT DEV/EVAL FOR AVR32 AT32UC3AATAVRONEKIT - KIT AVR/AVR32 DEBUGGER/PROGRMMRATEVK1100 - KIT DEV/EVAL FOR AVR32 AT32UC3A
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

34.5.2.4
34.5.2.5
32072C–AVR32–2010/03
INTEST
CLAMP
This instruction selects the boundary-scan chain as Data Register for testing internal logic in the
device. The logic inputs are determined by the boundary-scan chain, and the logic outputs are
captured by the boundary-scan chain. The device output pins are driven from the boundary-scan
chain.
Starting in Run-Test/Idle, the INTEST instruction is accessed the following way:
Table 34-13. INTEST Details
This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the internal logic
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the internal logic is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the boundary-scan chain is applied to internal logic
10. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
inputs.
inputs.
Details
00100 (0x04)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
AT32UC3A3/A4
950