mcf5272 Freescale Semiconductor, Inc, mcf5272 Datasheet - Page 484

• Manufacturer Part Number: mcf5272
• Description: Mcf5272 Coldfire Integrated Microprocessor User
• Manufacturer: Freescale Semiconductor, Inc

JTAG Test Access Port and BDM Debug Port
The MCF5272 implementation can do the following:
Figure 21-1 shows the MCF5272 implementation of IEEE 1149.1.
21.2 JTAG Test Access Port and BDM Debug Port
The JTAG test interface shares pins with the debug modules (see Table 21-1).
21-2
TMS
TCK
TDI
• Perform boundary scan operations to test circuit board electrical continuity
• Sample MCF5272 system pins during operation and transparently shift out the result
• Bypass the MCF5272 for a given circuit board test by effectively reducing the
• Disable the output drive to pins during circuit-board testing
• Drive output pins to stable levels
in the boundary scan register
boundary-scan register to a single bit
Precautions to ensure that the IEEE 1149.1 test logic does not
interfere with non-test operation are described in Section 21.7,
“Non-IEEE 1149.1 Operation.”
Controller
TAP
Figure 21-1. Test Access Port Block Diagram
3
4-Bit Instruction Register
Boundary-Scan Register
Decoder
Test Data Register
MCF5272MCF5272 User’s Manual
ID (32 bits)
Bypass
0
(1 Bit)
NOTE:
MOTOROLA
TDC