mcf5272 Freescale Semiconductor, Inc, mcf5272 Datasheet - Page 450

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mcf5272

Manufacturer Part Number
mcf5272
Description
Mcf5272 Coldfire Integrated Microprocessor User
Manufacturer
Freescale Semiconductor, Inc
Datasheet

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JTAG Test Access Port and BDM Debug Port
19.16.3.4 INT4 and Port 3 GCI/IDL Data In (INT4/DIN3)
IDL mode: This pin can be configured as a dedicated input, DIN3, for clocking data into
IDL port 3. Data is clocked into DIN3 on the falling edge of DCL1. Data is clocked into
DIN3 on the falling edge of DCL1. This is done by setting a bit in the PLIC module
configuration register. Note that the appropriate bits must be set in the pin configuration
register to reassign this pin from the interrupt module to the PLIC module.
GCI mode: This pin can be configured as a dedicated input, DIN3, for clocking data into
GCI port 3. DCL1 is twice the bit rate, that is, two clocks per data bit. This is done by setting
a bit in the PLIC module configuration register. Note that the appropriate bits must be set
in the pin configuration register to reassign this spin from the interrupt module to the PLIC
module.
Interrupt mode: This signal can be configured as interrupt input 4.
19.17 JTAG Test Access Port and BDM Debug Port
The MCF5272 supports the Motorola background debug mode (BDM) for ColdFire
processors. It also supports a JTAG test interface.
The following signals do not support JTAG due to the critical timing required to support
SDRAM memory: BS[3:0], RAS0, CAS0, SDCLK, SDCLKE, SDRAMCS/CS7, SDWE,
A10_PRECHG, SDBA[1:0], D[31:0], A[15:0].
19.17.1 Test Clock (TCK/PSTCLK)
JTAG mode: TCK is the dedicated JTAG test logic clock, independent of the CPU system
clock. This input provides a clock for on-board test logic defined by the IEEE 1149.1
standard.
TCK should be grounded if the JTAG port is not used and MTMOD is tied low.
BDM mode: PSTCLK is an output at the same frequency as the CPU clock. It is used for
indicating valid processor status data on the PST and DDATA pins.
19.17.2 Test Mode Select and Force Breakpoint (TMS/BKPT)
JTAG mode: The TMS input controls test mode operations for on-board test logic defined
by the IEEE 1149.1 standard. Connecting TMS to VDD disables the test controller, making
all JTAG circuits transparent to the system.
BDM mode: The hardware breakpoint input, BKPT, requires a 10-K) pullup resistor.
19-36
MCF5272 User’s Manual
MOTOROLA

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