pc87591l National Semiconductor Corporation, pc87591l Datasheet - Page 253

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pc87591l

Manufacturer Part Number
pc87591l
Description
Lpc Mobile Embedded Controllers
Manufacturer
National Semiconductor Corporation
Datasheet

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Revision 1.07
Embedded Controller Modules
Flash ID Read
To identify the device version, perform the following sequence:
1. Enable flash access (if not already enabled).
2. Read the Device ID (SID and SRID register values), using the Device ID Scan, as follows:
4.19.5 Test Access Port (TAP)
This section defines the top-level design of the TAP, as illustrated in Figure 81. Subsequent sections provide detailed TAP
design requirements.
The TAP includes the following elements:
The Instruction and data registers have separate shift register-based paths connected in parallel. These registers have a
common serial data input and a common serial data output connected to the TAP TDI and TDO signals, respectively.
The TAP controller selects between TDI and TDO as the alternative instruction and data register paths.
a. Set the IR to Device ID Scan instruction.
b. Scan the LF_ID chain.
TAP signals
TAP controller
Instruction Register (IR)
Data registers (Debugger and Flash interfaces).
TMS
TDI
TCK
BYPASS Register
DBGMASKS Register
FL_ERASE Register
FL_CT_ST Register
FL_ADDR Register
FL_DATA Register
FL_ID Register
Instruction Decode
DBGDATA Register
Instruction Register
(Continued)
Figure 81. TAP Block Diagram
253
Clocks and/or Controls
TAP Controller
G
Output Buffer
www.national.com
TDO

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