MOD5272-100IR NetBurner Inc, MOD5272-100IR Datasheet - Page 489
![PROCESSOR MODULE FLASH MOD5272](/photos/6/75/67555/mod5272-100ir_sml.jpg)
MOD5272-100IR
Manufacturer Part Number
MOD5272-100IR
Description
PROCESSOR MODULE FLASH MOD5272
Manufacturer
NetBurner Inc
Type
Controllers & Processorsr
Datasheets
1.MOD5272-100IR.pdf
(2 pages)
2.MOD5272-100IR.pdf
(3 pages)
3.MOD5272-100IR.pdf
(550 pages)
Specifications of MOD5272-100IR
Module/board Type
Processor Module
Ethernet Connection Type
10/100 Ethernet Port RJ-45
Operating Voltage
3.3 V
Product
Modules
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With/related Products
MOD5272
For Use With
528-1001 - KIT DEVELOP NETWORK FOR MOD5272
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
528-1008
- Current page: 489 of 550
- Download datasheet (6Mb)
MOTOROLA
21.5 Instruction Register
The MCF5272 IEEE 1149.1 implementation includes the three mandatory public
instructions (EXTEST, SAMPLE/PRELOAD, and BYPASS), the optional public ID
instruction, plus two additional public instructions (CLAMP and HI-Z) defined by IEEE
1149.1. The MCF5272 includes a 4-bit instruction register without parity, consisting of a
shift register with four parallel outputs. Data is transferred from the shift register to the
parallel outputs during the update-IR controller state. The 4 bits are used to decode the
instructions in Table 21-2.
The parallel output of the instruction register is reset to 0001 in the test-logic-reset
controller state. Note that this preset state is equivalent to the ID instruction.
B[3:0] Instruction
0000
0001
EXTEST
ID
NOTE: More than one lO.Cell could be serially connected and controlled by a single En.Cell.
Figure 21-7. General Arrangement for Bidirectional Pins
INPUT
The external test (EXTEST) instruction selects the boundary scan register. EXTEST asserts
internal reset for the MCF5272 system logic to force a predictable benign internal state while
performing external boundary scan operations.
By using the TAP, the register is capable of a) scanning user-defined values into the output
buffers, b) capturing values presented to input pins, c) controlling the direction of bidirectional
pins, and d) controlling the output drive of three-state output pins. For more details on the
function and uses of EXTEST, please refer to the IEEE 1149.1 document.
During the capture-IR controller state, the parallel inputs to the instruction shift register are
loaded with the 4-bit binary value (0001). The parallel outputs, however, remain unchanged
by this action since an update-IR signal is required to modify them.
DATA
O
E
O
Chapter 21. IEEE 1149.1 Test Access Port (JTAG)
FROM LAST CEL
Table 21-2. Instructions
TO NEXT CEL
EN.CELL
IO.CELL
*
*
DIRECTION
Description
OUTPUT
ENABLE
Instruction Register
I/O
PIN
21-7
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