MOD5272-100IR NetBurner Inc, MOD5272-100IR Datasheet - Page 484

PROCESSOR MODULE FLASH MOD5272

MOD5272-100IR

Manufacturer Part Number
MOD5272-100IR
Description
PROCESSOR MODULE FLASH MOD5272
Manufacturer
NetBurner Inc
Type
Controllers & Processorsr

Specifications of MOD5272-100IR

Module/board Type
Processor Module
Ethernet Connection Type
10/100 Ethernet Port RJ-45
Operating Voltage
3.3 V
Product
Modules
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With/related Products
MOD5272
For Use With
528-1001 - KIT DEVELOP NETWORK FOR MOD5272
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
528-1008
JTAG Test Access Port and BDM Debug Port
The MCF5272 implementation can do the following:
Figure 21-1 shows the MCF5272 implementation of IEEE 1149.1.
21.2 JTAG Test Access Port and BDM Debug Port
The JTAG test interface shares pins with the debug modules (see Table 21-1).
21-2
TMS
TCK
TDI
• Perform boundary scan operations to test circuit board electrical continuity
• Sample MCF5272 system pins during operation and transparently shift out the result
• Bypass the MCF5272 for a given circuit board test by effectively reducing the
• Disable the output drive to pins during circuit-board testing
• Drive output pins to stable levels
in the boundary scan register
boundary-scan register to a single bit
Precautions to ensure that the IEEE 1149.1 test logic does not
interfere with non-test operation are described in Section 21.7,
“Non-IEEE 1149.1 Operation.”
Controller
TAP
Figure 21-1. Test Access Port Block Diagram
3
4-Bit Instruction Register
Boundary-Scan Register
Decoder
Test Data Register
MCF5272MCF5272 User’s Manual
ID (32 bits)
Bypass
0
(1 Bit)
NOTE:
MOTOROLA
TDC

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