MCF5272VF66 Freescale, MCF5272VF66 Datasheet - Page 482

MCF5272VF66

Manufacturer Part Number
MCF5272VF66
Description
Manufacturer
Freescale
Datasheet

Specifications of MCF5272VF66

Family Name
MCF5xxx
Device Core
ColdFire
Device Core Size
32b
Frequency (max)
66MHz
Instruction Set Architecture
RISC
Supply Voltage 1 (typ)
3.3V
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
196
Package Type
MA-BGA
Lead Free Status / RoHS Status
Not Compliant

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IEEE 1149.1 Test Access Port (JTAG)
Figure 21-8
21.6
The control afforded by the output enable signals using the boundary scan register and the EXTEST
instruction requires a compatible circuit board test environment to avoid configurations that could damage
the device. The user must avoid situations in which the MCF5272 output drivers are enabled into actively
driven networks. Overdriving the TDO driver when it is active is not recommended.
21.7
In non-IEEE 1149.1 operation, IEEE 1149.1 test logic must be made transparent to system logic by forcing
the TAP controller into test-logic-reset state, which takes at least five consecutive TCK rising edges with
TMS high. TMS has an internal pull-up resistor and may be left unconnected.
If TMS is unconnected or connected to V
regardless of the TCK state. This requires the TMS, TCK, and TDI inputs to be high.
21-8
Restrictions
Non-IEEE 1149.1 Operation
shows the structure of the bypass register.
MCF5272 ColdFire
Figure 21-8. Bypass Register
®
Integrated Microprocessor User’s Manual, Rev. 3
CC
, the TAP controller cannot exit test-logic-reset state,
Freescale Semiconductor

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