BMSKTOPASA900(DCE) Toshiba, BMSKTOPASA900(DCE) Datasheet - Page 35

• Manufacturer Part Number: BMSKTOPASA900(DCE)
• Description: KIT STARTER TMPA900 USB JTAG
• Manufacturer: Toshiba
• Series: TOPASr
• Type: MCUr

Specifications of BMSKTOPASA900(DCE)

• Contents: Evaluation Board, Cable(s), Software and Documentation
• For Use With/related Products: TMPA900CMXBG
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

3.2.3
double-sided component mounting on printed-circuit boards (PCBs), and set-in recesses,
in-circuit tests that depend upon physical contact like the connection of the internal board and
chip has become more and more difficult to use. The more ICs have become complex, the lager
and more difficult the test program became.
circuit is a series of shift register cells placed between the pins and the internal circuitry of the
IC to which the said pins are connected. Normally, these boundary-scan cells are bypassed;
when the IC enters test mode, however, the scan cells can be directed by the test program to
pass data along the shift register path and perform various diagnostic tests. To accomplish this,
the tests use the six signals, TCK, TMS, TDI, TDO, RTCK and TRSTn.
chapter) allows testing of the connections between the processor, the printed circuit board to
which it is attached, and the other components on the circuit board.
With the evolution of ever-denser integrated circuits (ICs), surface-mounted devices,
As one of the solutions,
The JTAG boundary-scan mechanism (hereinafter referred to as
The JTAG mechanism cannot test the processor alone.
What Is Boundary Scan?
boundary-scan
TENTATIVE
TMPA900CM- 34
circuits started to be developed. A boundary-scan
JTAG mechanism
TMPA900CM
2009-10-14
in the