sc9s12hy64j0vllr Freescale Semiconductor, Inc, sc9s12hy64j0vllr Datasheet - Page 739

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sc9s12hy64j0vllr

Manufacturer Part Number
sc9s12hy64j0vllr
Description
S12 Microcontrollers Mcu 16-bit Hcs12 Cisc 32kb Flash 5v Tray
Manufacturer
Freescale Semiconductor, Inc
Datasheet
Freescale Semiconductor
1. T
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
3. Spec table quotes typical endurance evaluated at 25 C for this product family. For additional information on how Freescale
Conditions are shown in
Num C
application.
to 25 C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618
defines Typical Endurance, please refer to Engineering Bulletin EB619.
1
2
3
4
5
6
Javg
does not exceed 85 C in a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention at an average junction temperature of T
C Program Flash number of program/erase cycles
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data Flash number of program/erase cycles (-40 C tj 150 C
85 C
(-40 C
85 C
85 C
85 C
(1)
1
1
1
All values shown in
characterization.
after up to 50,000 program/erase cycles
after up to 10,000 program/erase cycles
after less than 100 program/erase cycles
after up to 10,000 program/erase cycles
tj
150 C
Table A-4
MC9S12HY/HA-Family Reference Manual, Rev. 1.04
unless otherwise noted
Table A-17. NVM Reliability Characteristics
Rating
Table A-17
Program Flash Arrays
Data Flash Array
are preliminary and subject to further
NOTE
Javg
Javg
Javg
Javg
=
=
=
=
Symbol
t
t
t
t
NVMRET
NVMRET
NVMRET
NVMRET
n
n
FLPE
FLPE
Min
10K
50K
20
10
20
5
100K
500K
100
100
100
100
Typ
Electrical Characteristics
(2)
2
2
2
(3)
3
Max
Cycles
Cycles
Years
Years
Years
Years
Unit
739

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