MMC2114CFCAG33 Freescale Semiconductor, MMC2114CFCAG33 Datasheet - Page 572
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MMC2114CFCAG33
Manufacturer Part Number
MMC2114CFCAG33
Description
IC MCU 32BIT 33MHZ 144-LQFP
Manufacturer
Freescale Semiconductor
Series
MCorer
Specifications of MMC2114CFCAG33
Core Processor
M210
Core Size
32-Bit
Speed
33MHz
Connectivity
EBI/EMI, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
67
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
144-LQFP
Processor Series
MMC2114
Core
M-CORE
Data Bus Width
32 bit
Data Ram Size
32 KB
Interface Type
SCI/SPI
Maximum Clock Frequency
33 MHz
Number Of Programmable I/os
104
Number Of Timers
2
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
Controller Family/series
MCORE
No. Of I/o's
104
Ram Memory Size
32KB
Cpu Speed
33MHz
No. Of Timers
2
Embedded Interface Type
SCI, SPI
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
MMC2114CFCAG33
Manufacturer:
Freescale Semiconductor
Quantity:
135
Company:
Part Number:
MMC2114CFCAG33
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
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JTAG Test Access Port and OnCE
22.7 Bypass Register
22.8 Boundary Scan Register
22.9 Restrictions
Advance Information
572
An IEEE 1149.1 standard-compliant Bypass Register is included. This
register which creates a single bit shift register path from TDI to the
Bypass Register to TDO when the BYPASS instruction is selected.
An IEEE 1149.1 standard-compliant Boundary Scan Register is
included. The Boundary Scan Register is connected between TDI and
TDO when the EXTEST or SAMPLE/PRELOAD instructions are
selected. This register captures signal pin data on the input pins, forces
fixed values on the output signal pins, and selects the direction and drive
characteristics (a logic value or high impedance) of the bidirectional and
three-state signal pins.
The test logic is implemented using static logic design, and TCLK can be
stopped in either a high or low state without loss of data. The system
logic, however, operates on a different system clock which is not
synchronized to TCLK internally. Any mixed operation requiring the use
of the IEEE 1149.1 standard test logic, in conjunction with system
functional logic that uses both clocks, must have coordination and
synchronization of these clocks done externally.
The control afforded by the output enable signals using the boundary
scan register and the EXTEST instruction requires a compatible
circuit-board test environment to avoid device-destructive
configurations. The user must avoid situations in which the output
drivers are enabled into actively driven networks.
Freescale Semiconductor, Inc.
For More Information On This Product,
JTAG Test Access Port and OnCE
Go to: www.freescale.com
MMC2114 • MMC2113 • MMC2112 — Rev. 1.0
MOTOROLA
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