AT91SAM9263B-CU Atmel, AT91SAM9263B-CU Datasheet - Page 69

IC ARM9 MCU 200 MHZ 324-TFBGA

AT91SAM9263B-CU

Manufacturer Part Number
AT91SAM9263B-CU
Description
IC ARM9 MCU 200 MHZ 324-TFBGA
Manufacturer
Atmel
Series
AT91SAMr
Datasheets

Specifications of AT91SAM9263B-CU

Core Processor
ARM9
Core Size
16/32-Bit
Speed
240MHz
Connectivity
CAN, Ethernet, I²C, MMC, SPI, SSC, UART/USART, USB
Peripherals
AC'97, LCD, POR, PWM, WDT
Number Of I /o
160
Program Memory Size
128KB (128K x 8)
Program Memory Type
ROM
Ram Size
128K x 8
Voltage - Supply (vcc/vdd)
1.08 V ~ 1.32 V
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
324-TFBGA
Processor Series
AT91SAMx
Core
ARM926EJ-S
Data Bus Width
32 bit
Data Ram Size
96 KB
Interface Type
2-Wire, EBI, I2S, MCI, SPI, USART
Maximum Clock Frequency
200 MHz
Number Of Programmable I/os
160
Number Of Timers
4
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
AT91SAM-ICE, AT91-ISP, AT91SAM9263-EK
Minimum Operating Temperature
- 40 C
Package
324TFBGA
Device Core
ARM926EJ-S
Family Name
91S
Maximum Speed
200 MHz
Operating Supply Voltage
1.8|2.5|3.3 V
Controller Family/series
AT91SAM9xxx
No. Of I/o's
160
Ram Memory Size
96KB
Cpu Speed
240MHz
No. Of Timers
1
Rohs Compliant
Yes
For Use With
AT91SAM9263-EK - KIT EVAL FOR AT91SAM9263AT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Data Converters
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
Q3735625

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12.5.3
12.5.4
6249H–ATARM–27-Jul-09
JTAG Signal Description
Debug Unit
There are two scan chains inside the ARM9EJ-S processor which support testing, debugging,
and programming of the Embedded ICE-RT. The scan chains are controlled by the ICE/JTAG
port.
Embedded ICE mode is selected when JTAGSEL is low. It is not possible to switch directly
between ICE and JTAG operations. A chip reset must be performed after JTAGSEL is changed.
For further details on the Embedded In-Circuit-Emulator-RT, see the ARM document:
ARM9EJ-S Technical Reference Manual (DDI 0222A).
TMS is the Test Mode Select input which controls the transitions of the test interface state
machine.
TDI is the Test Data Input line which supplies the data to the JTAG registers (Boundary Scan
Register, Instruction Register, or other data registers).
TDO is the Test Data Output line which is used to serially output the data from the JTAG regis-
ters to the equipment controlling the test. It carries the sampled values from the boundary scan
chain (or other JTAG registers) and propagates them to the next chip in the serial test circuit.
NTRST (optional in IEEE Standard 1149.1) is a Test-ReSeT input which is mandatory in ARM
cores and used to reset the debug logic. On Atmel ARM926EJ-S-based cores, NTRST is a
Power On Reset output. It is asserted on power on. If necessary, the user can also reset the
debug logic with the NTRST pin assertion during 2.5 MCK periods.
TCK is the Test ClocK input which enables the test interface. TCK is pulsed by the equipment
controlling the test and not by the tested device. It can be pulsed at any frequency. Note the
maximum JTAG clock rate on ARM926EJ-S cores is 1/6th the clock of the CPU. This gives 5.45
kHz maximum initial JTAG clock rate for an ARM9E running from the 32.768 kHz slow clock.
RTCK is the Return Test Clock. Not an IEEE Standard 1149.1 signal added for a better clock
handling by emulators. From some ICE Interface probes, this return signal can be used to syn-
chronize the TCK clock and take not care about the given ratio between the ICE Interface clock
and system clock equal to 1/6th. This signal is only available in JTAG ICE Mode and not in
boundary scan mode.
The Debug Unit provides a two-pin (DXRD and TXRD) USART that can be used for several
debug and trace purposes and offers an ideal means for in-situ programming solutions and
debug monitor communication. Moreover, the association with two peripheral data controller
channels permits packet handling of these tasks with processor time reduced to a minimum.
The Debug Unit also manages the interrupt handling of the COMMTX and COMMRX signals
that come from the ICE and that trace the activity of the Debug Communication Channel.The
Debug Unit allows blockage of access to the system through the ICE interface.
A specific register, the Debug Unit Chip ID Register, gives information about the product version
and its internal configuration.
The AT91SAM9263 Debug Unit Chip ID value is 0x0196 07A0 on 32-bit width.
For further details on the Debug Unit, see the Debug Unit section.
AT91SAM9263
69

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