mcf5407 Freescale Semiconductor, Inc, mcf5407 Datasheet - Page 64

no-image

mcf5407

Manufacturer Part Number
mcf5407
Description
Mcf5407 Coldfire Integrated Microprocessor User
Manufacturer
Freescale Semiconductor, Inc
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
mcf5407AI162
Manufacturer:
FREESCALE
Quantity:
201
Part Number:
mcf5407AI162
Manufacturer:
FREESCAL
Quantity:
132
Part Number:
mcf5407AI162
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Part Number:
mcf5407AI162
Manufacturer:
ALTERA
0
Part Number:
mcf5407AI220
Manufacturer:
freescaie
Quantity:
6
Part Number:
mcf5407AI220
Manufacturer:
Freescale Semiconductor
Quantity:
135
Part Number:
mcf5407AI220
Manufacturer:
FREESCALE
Quantity:
1 831
Part Number:
mcf5407AI220
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Part Number:
mcf5407AI220
Manufacturer:
NXP
Quantity:
25
Part Number:
mcf5407CAI162
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Suggested Reading
The following literature may be helpful with respect to the topics in Part I:
Acronyms and Abbreviations
Table I-i contains acronyms and abbreviations are used in Part I.
I-xx
ADC
ALU
BDM
BIST
BSDL
CODEC
DAC
DMA
DSP
EA
EDO
FIFO
GPIO
I
IEEE
IFP
IPL
JEDEC
JTAG
LIFO
2
• Chapter 5, “Debug Support,” describes the Revision C enhanced hardware debug
• ColdFire Programmers Reference Manual, R1.0 (MCF5200PRM/AD)
• Using Microprocessors and Microcomputers: The Motorola Family, William C.
C
Term
support in the MCF5407. This revision of the ColdFire debug architecture
encompasses earlier revisions.
Wray, Ross Bannatyne, Joseph D. Greenfield
Analog-to-digital conversion
Arithmetic logic unit
Background debug mode
Built-in self test
Boundary-scan description language
Code/decode
Digital-to-analog conversion
Direct memory access
Digital signal processing
Effective address
Extended data output (DRAM)
First-in, first-out
General-purpose I/O
Inter-integrated circuit
Institute for Electrical and Electronics Engineers
Instruction fetch pipeline
Interrupt priority level
Joint Electron Device Engineering Council
Joint Test Action Group
Last-in, first-out
Table I-i. Acronyms and Abbreviated Terms
MCF5407 User’s Manual
Meaning

Related parts for mcf5407