LFXP2-5E-5FTN256I Lattice, LFXP2-5E-5FTN256I Datasheet - Page 88

• Manufacturer Part Number: LFXP2-5E-5FTN256I
• Description: FPGA - Field Programmable Gate Array 5K LUTs 172 I/O Inst on DSP 1.2V -5 Spd
• Manufacturer: Lattice

Specifications of LFXP2-5E-5FTN256I

• Number Of Macrocells: 5000
• Number Of Programmable I/os: 172
• Data Ram Size: 169984
• Supply Voltage (max): 1.26 V
• Maximum Operating Temperature: + 100 C
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT
• Supply Voltage (min): 1.14 V
• Package / Case: FTBGA-256
• Number Of Logic Elements/cells: *
• Number Of Labs/clbs: *
• Total Ram Bits: 169984
• Number Of I /o: 172
• Number Of Gates: -
• Voltage - Supply: 1.14 V ~ 1.26 V
• Mounting Type: *
• Operating Temperature: -40°C ~ 100°C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Lattice Semiconductor
Switching Test Conditions
Figure 3-11 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 3-6.
Figure 3-11. Output Test Load, LVTTL and LVCMOS Standards
Table 3-6. Test Fixture Required Components, Non-Terminated Interfaces
LVTTL and other LVCMOS settings (L -> H, H -> L)
LVCMOS 2.5 I/O (Z -> H)
LVCMOS 2.5 I/O (Z -> L)
LVCMOS 2.5 I/O (H -> Z)
LVCMOS 2.5 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
*CL Includes Test Fixture and Probe Capacitance
DUT
V
R1
R2
T
1M
100
R



1
3-33
1M
100
R



CL*
2
Test Poi nt
0pF
C
DC and Switching Characteristics
L
LatticeXP2 Family Data Sheet
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
V
V
V
V
OH
OL
CCIO
CCIO
+ 0.10
- 0.10
/2
/2
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
CCIO
CCIO
V
—
—
—
—
—
—
—
T