PNX1500E NXP Semiconductors, PNX1500E Datasheet - Page 293
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PNX1500E
Manufacturer Part Number
PNX1500E
Description
Manufacturer
NXP Semiconductors
Datasheet
1.PNX1500E.pdf
(828 pages)
Specifications of PNX1500E
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Table 10: Sampling and Pattern Generation Control Registers for the FIFO Queues
PNX15XX_PNX952X_SER_N_4
Product data sheet
Offset 0x10,4024 -> 0x030
31
30
29
28
27:26
25:24
23:22
Bit
Symbol
Unused
EN_EV_TSTAMP
EN_IR_CARRIER
EN_IR_FILTER
EN_CLOCK_SEL
EN_PAT_GEN_CLK
Unused
4.4 Sampling and Pattern Generation Control Registers for the FIFO
Queues
GPIO_EV<0-3>
Acces
s
R/W
R/W
R/W
R/W
R/W
Value
-
0
0
0
0
0
Rev. 4.0 — 03 December 2007
Description
Enables an event timestamp signal to be generated whenever the
last 32-bit word from a DMA buffer reaches the GPIO output pins.
This field is only valid in Pattern Generating modes, i.e.
FIFO_MODE[1] set to ‘1’.
This bit enables a sub-carrier for Ir transmission. FREQ_DIV[15:0] is
combined with CARRIER_DIV[4:0] to generate sub-carrier and TX
frequencies:
Note: This field is only valid in Pattern Generation using samples
mode (FIFO_MODE=11) with EN_CLOCK_SEL disabled.
This bit enables a received Ir signal to be filtered. No signal pulses
less than the period programmed in IR_FILTER are passed through
to the monitoring logic.
Note: This field is only valid in Signal Sampling mode
(FIFO_MODE=01) with EN_CLOCK_SEL disabled.
Enables an input signal selected by CLOCK_SEL to be used as the
external clock source:
Note: This field is only valid in Signal Sampling mode
(FIFO_MODE=01) and Pattern Generation using samples mode
(FIFO_MODE=11).
Enables the clock generated by the frequency divider to be sent out
of the chip during pattern generation using samples and frequency
divider mode:
Note: This field is only valid in Pattern Generation using samples
(FIFO_MODE=11) and frequency divider (EN_CLOCK_SEL -
disabled) mode
0 - Ir Carrier disabled, CARRIER_DIV[4:0] not used.
1 - Ir Carrier enabled, CARRIER_DIV[4:0] used.
00 - CLOCK_SEL disabled
10 - CLOCK_SEL disabled
01 - CLOCK_SEL enabled, sample on positive edge
11 - CLOCK_SEL enabled, sample on negative edge
00 - EN_PAT_GEN_CLK disabled
10 - EN_PAT_GEN_CLK disabled
01 - EN_PAT_GEN_CLK enabled, output the clock as is
11 - EN_PAT_GEN_CLK enabled, output the inverted clock
Chapter 8: General Purpose Input Output Pins
PNX15xx/952x Series
© NXP B.V. 2007. All rights reserved.
8-293
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