peb3456e Infineon Technologies Corporation, peb3456e Datasheet - Page 56
peb3456e
Manufacturer Part Number
peb3456e
Description
Channelized T3 Termination, With Ds3 Framer, M13 Multiplexer, T1/e1 Framers And 256-channel Hdlc/ppp Controller
Manufacturer
Infineon Technologies Corporation
Datasheet
1.PEB3456E.pdf
(424 pages)
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4.1.3
The test breakout function provides the capability to multiplex one of the incoming 28
receive tributaries to the outgoing test receive port, where an external T1/E1 analyzer
can be easily connected to. A selectable incoming tributary signal can be mapped to the
test receive port where RCLK(x) is mapped to TRCLK and RD(x) to TRD. TRD is
updated on the falling edge of TRCLK. In the opposite direction one of the 28 transmit
tributaries can be replaced with the incoming test transmit data input TTD and the test
transmit clock input TTCLK. TTD is sampled on the rising edge of TTCLK.
•
Figure 4-4
4.2
4.2.1
The time slot handler assigns any combination of time slots of ports configured in T1 or
E1 mode to logical channels. The assigned time slots are connected internally and the
bit stream of one logical channel is mapped continuously over the selected time slots.
Data Sheet
Test Breakout
Time slot Handler
Channelized Modes
RD44N
RD44P
TC44O
TD44N
TD44P
RC44
TC44
Test Breakout
Multiplexer
Transmit
Receive
Framer
Demux
Framer
DS3
M23
DS3
M23
+
+
Multiplexer
Transmit
Receive
Framer
Framer
Demux
DS2
M12
DS2
M12
+
+
56
RCLK(27)
TCLK(27)
RCLK(0)
TCLK(0)
RD(27)
TD(27)
RD(0)
TD(0)
Functional Description
PEB 3456 E
05.2001
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