PEF22827EL-V11 Lantiq, PEF22827EL-V11 Datasheet - Page 47

• Manufacturer Part Number: PEF22827EL-V11
• Manufacturer: Lantiq

Specifications of PEF22827EL-V11

• Lead Free Status / RoHS Status: Supplier Unconfirmed

Table 9
Pin
G12
L3
F15
G13
1)
Table 10
Pin
N3
H15
2.3.9
Table 11
Table 11
Pin
E12, F10, K9, M8, N7
G9, G10, L10
B15, C15
G2, K2
Preliminary Data Sheet
Pull Up (PU) buffers are 550 K
Name
TDO_D O
TMS_A
TMS_D I
TRST
Name
SCAN_
MODE
SCSEL
describes voltage supply pins while
Voltage Supply and Ground Pins
JTAG Pins (page 2 of 2)
Test Pins
Voltage Supply Pins (page 1 of 2)
Pin
Type
AI
I
Pin
Type
AI
I
Buffer
Type
-
-
-
PU
Buffer
Type
-
-
1)
Name
VDD_12
VDD_33
VDD_PLL
_12
VDDA
Function
Digital JTAG Test Serial Data Output
For testing only.
Analog JTAG Input Control
For testing only. Tie to 0 in normal mode.
Digital JTAG Input Control
For testing only. Tie to 0 in normal mode.
JTAG Test Reset
For testing only. Tie to 0 in normal mode.
Function
Scan Mode for Analog Core
For testing only. Determines scan test mode.
Tie to 0 in normal mode.
Digital Scan Select
Scan chain select. For testing only.
47
Pin
Type
PWR
PWR
PWR
PWR
Table 12
Buffer
Type
-
-
-
-
describes ground pins.
Pin and Signal Descriptions
Function
Supply Digital Core
Digital block, 1.2 V supply.
Supply Digital I/O
Analog block, 3.3 V supply.
Analog Supply for PLL
Digital block, 1.2 V supply.
Analog Supply for ADC
Analog block, 1.8 V supply.
Rev. 1.1, 2005-01-30
VDSL6100i
PEF 22827