PEF22827EL-V11 Lantiq, PEF22827EL-V11 Datasheet - Page 282

• Manufacturer Part Number: PEF22827EL-V11
• Manufacturer: Lantiq

Specifications of PEF22827EL-V11

• Lead Free Status / RoHS Status: Supplier Unconfirmed

Table 101
Parameter
Input low voltage
Input high voltage
Output low voltage
Output high voltage
Power supply current
(operational)
Input leakage current I
1)
Test Conditions
TA=-40 °C to 85 °C, VDD = 3.3 V 5%
Input signals are driven to 2.4 V for a logical 1 and to 0.4 V for a logical 0. Testing input
and output waveforms are shown in
Figure 54
12.6.4
This section describes the AC characteristics of the Analog Block.
12.6.4.1 AFE Transmission Path
Table 102
Preliminary Data Sheet
Valid for all digital I/O pins. All digital I/O pins are 3.3 V pads.
0.45V
2.4V
describes the electrical characteristics of the AFE transmission path.
AC Characteristics – Analog Block
DC Characteristics – Analog Block
Input and Output Waveform for AC Tests
1)
1)
1)
1)
2.0V
0.8V
V
V
V
V
I
I
Symbol
CC
CC
IL
IL
IH
OL
OH
Min. Typ. Max.
-0.3
2.0
2.4
10
170
Figure
Values
0.8
3.6
0.5
25
265
1.0
282
54.
2.0V
0.8V
Electrical Characteristics - Overview
Unit Test Condition
V
V
V
V
mA
mA
VDSL-A_0009_Waveform for AC Test
A
Test conditions defined in
Figure 54
I
I
VDD_IO = 3.3 V
VDDD/VDDA/VDDT/VDDR
= 1.8 V
VDDIO =3.3V, GND=0 V;
all other pins are floating;
V
OL
OH
IN
=10 mA sink current
=0 V, VDDP + 0.4
=-10 mA source current
Under Test
Device
Rev. 1.1, 2005-01-30
VDSL6100i
PEF 22827
C
L
=75pF