SAM9X25 Atmel Corporation, SAM9X25 Datasheet - Page 51

• Manufacturer Part Number: SAM9X25
• Manufacturer: Atmel Corporation

Specifications of SAM9X25

• Flash (kbytes): 0 Kbytes
• Pin Count: 217
• Max. Operating Frequency: 400 MHz
• Cpu: ARM926
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 105
• Ext Interrupts: 105
• Usb Transceiver: 3
• Usb Speed: Hi-Speed
• Usb Interface: Host, Device
• Spi: 2
• Twi (i2c): 3
• Uart: 7
• Can: 2
• Lin: 4
• Ssc: 1
• Ethernet: 2
• Sd / Emmc: 2
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 12
• Adc Resolution (bits): 10
• Adc Speed (ksps): 440
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 32
• Self Program Memory: NO
• External Bus Interface: 1
• Dram Memory: DDR/LPDDR, SDRAM/LPSDR
• Nand Interface: Yes
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 0.9 to 1.1
• Fpu: No
• Mpu / Mmu: No/Yes
• Timers: 6
• Output Compare Channels: 6
• Input Capture Channels: 6
• Pwm Channels: 4
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

10.6.4
10.6.5
11054A–ATARM–27-Jul-11
11054A–ATARM–27-Jul-11
Debug Unit
IEEE 1149.1 JTAG Boundary Scan
The Debug Unit provides a two-pin (DXRD and TXRD) USART that can be used for several
debug and trace purposes and offers an ideal means for in-situ programming solutions and
debug monitor communication. Moreover, the association with two peripheral data controller
channels permits packet handling of these tasks with processor time reduced to a minimum.
The Debug Unit also manages the interrupt handling of the COMMTX and COMMRX signals
that come from the ICE and that trace the activity of the Debug Communication Channel.The
Debug Unit allows blockage of access to the system through the ICE interface.
A specific register, the Debug Unit Chip ID Register, gives information about the product version
and its internal configuration.
The device Debug Unit Chip ID value is 0x819A_05A1 on 32-bit width.
For further details on the Debug Unit, see the Debug Unit section.
IEEE 1149.1 JTAG Boundary Scan allows pin-level access independent of the device packaging
technology.
IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST
and BYPASS functions are implemented. In ICE debug mode, the ARM processor responds
with a non-JTAG chip ID that identifies the processor to the ICE system. This is not IEEE 1149.1
JTAG-compliant.
It is not possible to switch directly between JTAG and ICE operations. A chip reset must be per-
formed after JTAGSEL is changed.
A Boundary-scan Descriptor Language (BSDL) file is provided to set up test.
SAM9X25
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