AT32UC3L0256 Atmel Corporation, AT32UC3L0256 Datasheet - Page 762

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AT32UC3L0256

Manufacturer Part Number
AT32UC3L0256
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of AT32UC3L0256

Flash (kbytes)
256 Kbytes
Pin Count
48
Max. Operating Frequency
50 MHz
Cpu
32-bit AVR
# Of Touch Channels
17
Hardware Qtouch Acquisition
Yes
Max I/o Pins
36
Ext Interrupts
36
Usb Speed
No
Usb Interface
No
Spi
5
Twi (i2c)
2
Uart
4
Lin
4
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
12
Adc Speed (ksps)
460
Analog Comparators
8
Resistive Touch Screen
No
Temp. Sensor
Yes
Crypto Engine
No
Sram (kbytes)
16
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
Yes
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.62 to 3.6
Operating Voltage (vcc)
1.62 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
6
Output Compare Channels
18
Input Capture Channels
12
Pwm Channels
35
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes

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31.5.2.6
31.5.3
31.5.3.1
32145A–12/2011
Private JTAG Instructions
NEXUS_ACCESS
BYPASS
Table 31-16. CLAMP Details
This instruction selects the 1-bit Bypass Register as Data Register.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
Table 31-17. BYPASS Details
The 32-bit AVR defines a number of private JTAG instructions, not defined by the JTAG stan-
dard. Each instruction is briefly described in text, with details following in table form.
This instruction allows Nexus-compliant access to the On-Chip Debug registers through the
SAB. The 7-bit register index, a read/write control bit, and the 32-bit data is accessed through
the JTAG port.
The data register is alternately interpreted by the SAB as an address register and a data regis-
ter. The SAB starts in address mode after the NEXUS_ACCESS instruction is selected, and
toggles between address and data mode each time a data scan completes with the busy bit
cleared.
NOTE: The polarity of the direction bit is inverse of the Nexus standard.
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
9. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
7. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
8. Return to Run-Test/Idle.
Details
00110 (0x06)
p0001
1
x
x
Details
11111 (0x1F)
p0001
1
x
x
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