mc9s12vr48 Freescale Semiconductor, Inc, mc9s12vr48 Datasheet - Page 562

• Manufacturer Part Number: mc9s12vr48
• Description: S12 Microcontrollers
• Manufacturer: Freescale Semiconductor, Inc

FTMRG Electrical Specifications
1
2
3
4
M.1.17
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The data retention and program/erase cycling failure rates are specified at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
562
Num C
12a
12b
10
11
Typical program and erase times are based on typical f
Maximum program and erase times are based on minimum f
t
Typical value for a new device
1
2
3
4
5
6
7
8
9
cyc
= 1 / f
D Erase all blocks (mass erase) time
D Erase verify all blocks (blank check) time
D Unsecure Flash time
D P-Flash block erase time
D P-Flash erase verify (blank check) time
D P-Flash sector erase time
D P-Flash phrase programming time
D D-Flash sector erase time
D D-Flash erase verify (blank check) time
D D-Flash one word programming time
D D-Flash two word programming time
Bus frequency
Operating frequency
NVMBUS
NVM Reliability Parameters
All values shown in
characterization.
Rating
MC9S12VR Family Reference Manual,
Preliminary - Subject to Change Without Notice
Table M-1. NVM Timing Characteristics
Table M-2
NVMOP
are preliminary and subject to further
NOTE
NVMOP
and maximum f
and maximum f
f
Symbol
NVMBUS
f
t
t
NVMOP
t
t
t
t
t
t
pcheck
dcheck
dpgm1
dpgm2
pmass
t
t
check
mass
ppgm
t
pera
dera
uns
NVMBUS
Rev. 2.2
Min
NVMBUS
0.8
—
—
—
—
—
—
—
—
—
—
—
1
Typ
185
20
140
1.0
1.4
4.0
1.3
20
97
—
—
—
—
4
1
Freescale Semiconductor
16700
Max
9300
1.05
1.46
1.33
200
770
106
154
4.1
25
26
26
2
Unit
MHz
MHz
t
t
t
ms
ms
ms
ms
ms
µs
µs
µs
cyc
cyc
cyc
3