mc9s12vr48 Freescale Semiconductor, Inc, mc9s12vr48 Datasheet - Page 513

• Manufacturer Part Number: mc9s12vr48
• Description: S12 Microcontrollers
• Manufacturer: Freescale Semiconductor, Inc

A.1.5
All ESD testing is in conformity with CDF-AEC-Q100 stress test qualification for automotive grade
integrated circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM) and the Charged-Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Freescale Semiconductor
Num
1
2
3
4
Human Body
Charged-
Latch-up for
Latch-up for
Device
5V GPIO’s
LS/HS/HVI/V
SENSE/LIN
Model
C
C
C
C
C
ESD Protection and Latch-up Immunity
Human Body Model (HBM):
-LIN vs LGND
-HS1,HS2,VSENSE,HVI[3:0] vs VSSX2
-all other pins
Charged-Device Model (CDM):
Corner Pins
Charged-Device Model (CDM):
all other pins
Direct Contact Discharge IEC61000-4-2 with and
LIN vs LGND
with out 220pF capacitor (R=330, C=150pF):
JESD22-A114
JESD22-C101
Spec
Table A-4. ESD Protection and Latch-up Characteristics
Table A-3. ESD and Latch-up Test Conditions
MC9S12VR Family Reference Manual, Rev. 2.2
Preliminary - Subject to Change Without Notice
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Series Resistance
Storage Capacitance
Minimum Input Voltage Limit
Maximum Input Voltage Limit
Minimum Input Voltage Limit
Maximum Input Voltage Limit
Rating
Description
V
Symbol
V
V
V
V
V
ESDIEC
CDM
CDM
HBM
HBM
HBM
Symbol
R
C
R
C
-
+/-750
+/-500
+/-6
+/-4
+/-2
+/-6
Min
1
MCU Electrical Specifications
Value
1500
+7.5
-2.5
100
+21
-7
3
3
0
4
-
Max
-
-
-
-
Unit
pF
pF
Ω
Ω
V
V
V
V
Unit
KV
KV
V
V
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