ATMEGA64RZAV-10PU Atmel, ATMEGA64RZAV-10PU Datasheet - Page 261

MCU ATMEGA644/AT86RF230 40-DIP

ATMEGA64RZAV-10PU

Manufacturer Part Number
ATMEGA64RZAV-10PU
Description
MCU ATMEGA644/AT86RF230 40-DIP
Manufacturer
Atmel
Series
ATMEGAr
Datasheets

Specifications of ATMEGA64RZAV-10PU

Frequency
2.4GHz
Modulation Or Protocol
802.15.4 Zigbee
Power - Output
3dBm
Sensitivity
-101dBm
Voltage - Supply
1.8 V ~ 3.6 V
Data Interface
PCB, Surface Mount
Memory Size
64kB Flash, 2kB EEPROM, 4kB RAM
Antenna Connector
PCB, Surface Mount
Package / Case
40-DIP (0.600", 15.24mm)
Wireless Frequency
2.4 GHz
Interface Type
JTAG, SPI
Output Power
3 dBm
For Use With
ATSTK600-TQFP32 - STK600 SOCKET/ADAPTER 32-TQFPATAVRISP2 - PROGRAMMER AVR IN SYSTEMATSTK500 - PROGRAMMER AVR STARTER KIT
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Operating Temperature
-
Applications
-
Data Rate - Maximum
-
Current - Transmitting
-
Current - Receiving
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
For Use With/related Products
ATmega64
23.3.4
23.4
23.4.1
23.4.2
23.4.3
2593N–AVR–07/10
Boundary-scan Specific JTAG Instructions
Boundary-scan Chain
EXTEST; 0x0
IDCODE; 0x1
SAMPLE_PRELOAD; 0x2
The Boundary-scan Chain has the capability of driving and observing the logic levels on the dig-
ital I/O pins, as well as the boundary between digital and analog logic for analog circuitry having
off-chip connections.
See
The Instruction Register is 4-bit wide, supporting up to 16 instructions. Listed below are the
JTAG instructions useful for Boundary-scan operation. Note that the optional HIGHZ instruction
is not implemented, but all outputs with tri-state capability can be set in high-impedant state by
using the AVR_RESET instruction, since the initial state for all port pins is tri-state.
As a definition in this datasheet, the LSB is shifted in and out first for all Shift Registers.
The OPCODE for each instruction is shown behind the instruction name in hex format. The text
describes which Data Register is selected as path between TDI and TDO for each instruction.
Mandatory JTAG instruction for selecting the Boundary-scan Chain as Data Register for testing
circuitry external to the AVR package. For port-pins, Pull-up Disable, Output Control, Output
Data, and Input Data are all accessible in the scan chain. For Analog circuits having off-chip
connections, the interface between the analog and the digital logic is in the scan chain. The con-
tents of the latched outputs of the Boundary-scan chain is driven out as soon as the JTAG IR-
Register is loaded with the EXTEST instruction.
The active states are:
• Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
• Shift-DR: The Internal Scan Chain is shifted by the TCK input.
• Update-DR: Data from the scan chain is applied to output pins.
Optional JTAG instruction selecting the 32 bit ID-Register as Data Register. The ID-Register
consists of a version number, a device number and the manufacturer code chosen by JEDEC.
This is the default instruction after power-up.
The active states are:
• Capture-DR: Data in the IDCODE Register is sampled into the Boundary-scan Chain.
• Shift-DR: The IDCODE scan chain is shifted by the TCK input.
Mandatory JTAG instruction for pre-loading the output latches and taking a snap-shot of the
input/output pins without affecting the system operation. However, the output latches are not
connected to the pins. The Boundary-scan Chain is selected as Data Register.
The active states are:
• Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
• Shift-DR: The Boundary-scan Chain is shifted by the TCK input.
”Boundary-scan Chain” on page 262
for a complete description.
ATmega644
261

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