SAK-TC1796-256F150E BD Infineon Technologies, SAK-TC1796-256F150E BD Datasheet - Page 64

• Manufacturer Part Number: SAK-TC1796-256F150E BD
• Description: IC MCU 32BIT FLASH PG-BGA-416
• Manufacturer: Infineon Technologies
• Series: TC17xxr

Specifications of SAK-TC1796-256F150E BD

• Core Processor: TriCore
• Core Size: 32-Bit
• Speed: 150MHz
• Connectivity: ASC, CAN, EBI/EMI, MLI, MSC, SSC
• Peripherals: DMA, POR, WDT
• Number Of I /o: 123
• Program Memory Size: 2MB (2M x 8)
• Program Memory Type: FLASH
• Ram Size: 256K x 8
• Voltage - Supply (vcc/vdd): 1.42 V ~ 1.58 V
• Data Converters: A/D 44x12b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 416-BGA
• Packages: PG-BGA-416
• Max Clock Frequency: 150.0 MHz
• Sram (incl. Cache): 256.0 KByte
• Can Nodes: 4
• A / D Input Lines (incl. Fadc): 44
• Program Memory: 2.0 MB
• For Use With: B158-H8537-G2-X-7600IN - KIT STARTER TC179X FAMILY
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Other names: KT1796256F150EBDXP; SAK-TC1796-256F150EBDIN; SP000228336

The A/D converters operate by the method of the successive approximation. A
multiplexer selects between up to 32 analog inputs that can be connected with the 16
conversion channels in each ADC module. An automatic self-calibration adjusts the ADC
modules to changing temperatures or process variations.
External Clock control, address decoding, and service request (interrupt) control is
managed outside the ADC module kernel. A synchronization bridge is used for
synchronization of two ADC modules. External trigger conditions are controlled by an
External Request Unit. This unit generates the control signals for auto-scan control
(ASGT), software trigger control (SW0TR, SW0GT), the event trigger control (ETR,
EGT), queue control (QTR, QGT), and timer trigger control (TTR, TGT).
Features
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Data Sheet
8-bit, 10-bit, 12-bit A/D conversion
Minimum conversion times (without sample time, @ 75 MHz module clock):
– 1.05 µs @ 8-bit resolution
– 1.25 µs @ 10-bit resolution
– 1.45 µs @ 12-bit resolution
Extended channel status information on request source
Successive approximation conversion method
Total Unadjusted Error (TUE) of ±2 LSB @ 10-bit resolution
Integrated sample & hold functionality
Direct control of up to 16(32) analog input channels per ADC
Dedicated control and status registers for each analog channel
Powerful conversion request sources
Selectable reference voltages for each channel
Programmable sample and conversion timing schemes
Limit checking
Flexible ADC module service request control unit
Synchronization of the two on-chip A/D converters
Automatic control of external analog multiplexers
Equidistant samples initiated by timer
External trigger and gating inputs for conversion requests
Power reduction and clock control feature
On-chip die temperature sensor output voltage measurement via ADC1
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Functional Description
V1.0, 2008-04
TC1796