cx29503 Mindspeed Technologies, cx29503 Datasheet - Page 43

• Manufacturer Part Number: cx29503
• Description: Cx29503 Broadband Access Multiplexer Data Sheet
• Manufacturer: Mindspeed Technologies

CX29503 Data Sheet
Table 1-7. Pin Type Definitions
Table 1-8. Pin Definitions(1 of 6)
29503-DSH-002-B
GENERAL NOTE:
Inputs or Bidirectional pins that act as inputs upon power up must be externally driven to either V
functionality and integrity unless they have internal terminations as indicated in this table.
CLK_TEST[16:0]
Symbol
TSTBUS[17:0]
IO12
ODO
TMODE[3:0]
O12
IPU
PI5
O2
PC
GC
PI
GI
SCAN_EN
I
Symbol
TRST_N
TMS
TDO
TCK
TDI
Input pin, CMOS levels, no internal termination
Input pin, CMOS levels, 75 kΩ internal pull-up
Three-state-capable CMOS output pin; 2 mA drive, 120 Ω equivalent drive impedance
Three-state-capable CMOS output pin; 12 mA drive, 32 Ω equivalent drive impedance
Three-state-capable CMOS bidirectional pin; 12 mA drive, 32 Ω equivalent drive impedance
Open drain output; no internal pull up; 12 mA current sink
Digital power pin for core circuits
Digital power pin for I/O pads
Digital power pin for internal ESD circuits
Digital ground pin for core circuits
Digital ground pin for I/O pads
Reset
low
low
—
—
—
—
—
—
—
(1)
Type
O12
IPU
IPU
IPU
IPU
O2
I
I
I
Mindspeed Technologies™
(2)
JTAG/Scan and Test Access
Preliminary Information
Signal
Name
—
—
—
—
—
—
—
—
—
Name and Function
JTAG Clock—Used to clock-in the TDI and TMS signals and
as a clock-out for the TDO signal.
JTAG Reset—An active-low input used to reset the JTAG
logic. IEEE 1149.1 recommends this pin be pulled low in
normal system operation.
JTAG Data Input—The test signal used to receive serial test
instructions and test data.
JTAG Mode Select—The test signal input decoded by the
Test Access Port (TAP) controller to control test operations.
JTAG Data Output—The test signal used to transmit serial
test instructions and test data.
Test Mode—Reserved.
Test Bus—Reserved.
Test Port—Test inputs used by Mindspeed for internal test
modes. These inputs should be tied to VSSIO.
Scan Enable—Reserved for manufacturing and debug.
Must be connected to ground for normal operation.
Name and Function
il
or V
ih
levels for correct device
1
-
17