SAM3U2C Atmel Corporation, SAM3U2C Datasheet - Page 231
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SAM3U2C
Manufacturer Part Number
SAM3U2C
Description
Manufacturer
Atmel Corporation
Specifications of SAM3U2C
Flash (kbytes)
128 Kbytes
Pin Count
100
Max. Operating Frequency
96 MHz
Cpu
Cortex-M3
# Of Touch Channels
28
Hardware Qtouch Acquisition
No
Max I/o Pins
57
Ext Interrupts
57
Usb Transceiver
1
Quadrature Decoder Channels
1
Usb Speed
Hi-Speed
Usb Interface
Device
Spi
4
Twi (i2c)
1
Uart
4
Ssc
1
Sd / Emmc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
12
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
36
Self Program Memory
YES
External Bus Interface
1
Dram Memory
No
Nand Interface
Yes
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
1.62 to 3.6
Fpu
No
Mpu / Mmu
Yes / No
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
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14.3
14.4
14.4.1
6430E–ATARM–29-Aug-11
Debug and Test Pin Description
Functional Description
Test Pin
Figure 14-3. Application Test Environment Example
Table 14-1.
Note:
One dedicated pin, TST, is used to define the device operating mode. When this pin is at low
level during power-up, the device is in normal operating mode. When at high level, the device is
in test mode or FFPI mode. The TST pin integrates a permanent pull-down resistor of about
15 kΩ, so that it can be left unconnected for normal operation. Note that when setting the TST pin
Signal Name
NRST
TST
TCK/SWCLK
TDI
TDO/TRACESWO
TMS/SWDIO
JTAGSEL
1. TDO pin is set in input mode when the Cortex-M3 Core is not in debug mode. Thus an external
pull-up (100 kΩ) must be added to avoid current consumption due to floating input.
Debug and Test Signal List
SAM3-based Application Board In Test
Connector
JTAG
Probe
JTAG
Function
Microcontroller Reset
Test Select
Test Clock/Serial Wire Clock
Test Data In
Test Data Out/Trace Asynchronous
Data Out
Test Mode Select/Serial Wire
Input/Output
JTAG Selection
SAM3
Chip n
SWD/JTAG
Reset/Test
Test Adaptor
Chip 2
Chip 1
Tester
Input/Output
Output
Type
Input
Input
Input
Input
Input
SAM3U Series
(1)
Active Level
High
Low
231
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