C8051F902-GM Silicon Laboratories Inc, C8051F902-GM Datasheet - Page 81

• Manufacturer Part Number: C8051F902-GM
• Description: IC MCU 8BIT 8KB FLASH 24QFN
• Manufacturer: Silicon Laboratories Inc
• Series: C8051F9xxr

Specifications of C8051F902-GM

• Program Memory Type: FLASH
• Program Memory Size: 8KB (8K x 8)
• Package / Case: 24-QFN
• Core Processor: 8051
• Core Size: 8-Bit
• Speed: 25MHz
• Connectivity: SMBus (2-Wire/I²C), SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, POR, PWM, Temp Sensor, WDT
• Number Of I /o: 16
• Ram Size: 768 x 8
• Voltage - Supply (vcc/vdd): 0.9 V ~ 3.6 V
• Data Converters: A/D 15x10/12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Processor Series: C8051F9x
• Core: 8051
• Data Ram Size: 768 B
• Interface Type: UART
• Maximum Clock Frequency: 25 MHz
• Number Of Timers: 4
• Operating Supply Voltage: 0.9 V to 3.6 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: PK51, CA51, A51, ULINK2
• Development Tools By Supplier: C8051F912DK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 12 bit
• Package: 24QFN EP
• Device Core: 8051
• Family Name: C8051F90x
• Maximum Speed: 25 MHz
• Data Bus Width: 8 Bit
• Number Of Programmable I/os: 16
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 336-1848-5

5.8.1. Calibration
The uncalibrated temperature sensor output is extremely linear and suitable for relative temperature mea-
surements (see Table 4.11 for linearity specifications). For absolute temperature measurements, offset
and/or gain calibration is recommended. Typically a 1-point (offset) calibration includes the following steps:
Figure 5.9 shows the typical temperature sensor error assuming a 1-point calibration at 25 °C. Parame-
ters that affect ADC measurement, in particular the voltage reference value, will also affect temper-
ature measurement.
A single-point offset measurement of the temperature sensor is performed on each device during produc-
tion test. The measurement is performed at 25 °C ±5 °C, using the ADC with the internal high speed refer-
ence buffer selected as the Voltage Reference. The direct ADC result of the measurement is stored in the
SFR registers TOFFH and TOFFL, shown in SFR Definition 5.13 and SFR Definition 5.14.
Figure 5.9. Temperature Sensor Error with 1-Point Calibration (V
1. Control/measure the ambient temperature (this temperature must be known).
2. Power the device, and delay for a few seconds to allow for self-heating.
3. Perform an ADC conversion with the temperature sensor selected as the positive input and
4. Calculate the offset characteristics, and store this value in non-volatile memory for use with
GND selected as the negative input.
subsequent temperature sensor measurements.
-1.00
-2.00
-3.00
-4.00
-5.00
5.00
4.00
3.00
2.00
1.00
0.00
-40.00
-20.00
0.00
Temperature (degrees C)
Rev. 1.0
20.00
C8051F91x-C8051F90x
40.00
60.00
REF
80.00
= 1.68 V)
5.00
4.00
3.00
2.00
1.00
0.00
-1.00
-2.00
-3.00
-4.00
-5.00
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