AT91SAM7L64-AU Atmel, AT91SAM7L64-AU Datasheet - Page 53

MCU ARM7 64K HS FLASH 128-LQFP

AT91SAM7L64-AU

Manufacturer Part Number
AT91SAM7L64-AU
Description
MCU ARM7 64K HS FLASH 128-LQFP
Manufacturer
Atmel
Series
AT91SAMr
Datasheets

Specifications of AT91SAM7L64-AU

Core Processor
ARM7
Core Size
16/32-Bit
Speed
36MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, LCD, POR, PWM, WDT
Number Of I /o
80
Program Memory Size
64KB (64K x 8)
Program Memory Type
FLASH
Ram Size
6K x 8
Voltage - Supply (vcc/vdd)
1.55 V ~ 1.8 V
Data Converters
A/D 4x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
128-LQFP
Controller Family/series
AT91SAM7xxx
No. Of I/o's
80
Ram Memory Size
6KB
Cpu Speed
36MHz
No. Of Timers
1
Rohs Compliant
Yes
Processor Series
AT91SAMx
Core
ARM7TDMI
Data Bus Width
32 bit
Data Ram Size
6 KB
Interface Type
2-Wire, SPI, USART
Maximum Clock Frequency
36 MHz
Number Of Programmable I/os
80
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
Development Tools By Supplier
AT91SAM-ICE, AT91-ISP, AT91SAM7L-EK
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 4 Channel
For Use With
AT91SAM7L-STK - KIT EVAL FOR AT91SAM7LAT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT91SAM7L64-AU
Manufacturer:
Atmel
Quantity:
10 000
12.3.2
12.4
6257A–ATARM–20-Feb-08
Debug and Test Pin Description
Test Environment
Figure 12-3
tester. In this example, the “board in test” is designed using a number of JTAG-compliant
devices. These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
JTAGSEL
DRXD
DTXD
shows a test environment example. Test vectors are sent and interpreted by the
Debug and Test Pin List
AT91SAM7Lxx-based Application Board In Test
Connector
ICE/JTAG
Interface
AT91SAM7Lxx
JTAG
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
JTAG Selection
Debug Receive Data
Debug Transmit Data
AT91SAM7L128/64 Preliminary
Chip n
ICE and JTAG
Debug Unit
Reset/Test
Test Adaptor
Chip 2
Chip 1
Tester
Input/Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Active Level
High
Low
53

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