S9S12XS256J0CAL Freescale Semiconductor, S9S12XS256J0CAL Datasheet - Page 684

• Manufacturer Part Number: S9S12XS256J0CAL
• Description: MCU 256K FLASH 112-LQFP
• Manufacturer: Freescale Semiconductor
• Series: HCS12r

Specifications of S9S12XS256J0CAL

• Core Processor: HCS12X
• Core Size: 16-Bit
• Speed: 40MHz
• Connectivity: CAN, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 91
• Program Memory Size: 256KB (256K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 8K x 8
• Ram Size: 12K x 8
• Voltage - Supply (vcc/vdd): 1.72 V ~ 5.5 V
• Data Converters: A/D 16x12b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 112-LQFP
• Processor Series: S12XS
• Core: HCS12
• Data Bus Width: 16 bit
• Data Ram Size: 12 KB
• Interface Type: CAN, SCI, SPI
• Maximum Clock Frequency: 40 MHz
• Number Of Programmable I/os: 91
• Number Of Timers: 12
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWHCS12
• Development Tools By Supplier: DEMO9S12XSFAME, EVB9S12XEP100
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 12 bit, 16 Channel
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Electrical Characteristics
684
1
2
3
Conditions are shown in
Num C
T
application.
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618
T
application.
1
2
3
4
5
6
7
Javg
Javg
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C P-Flash number of program/erase cycles
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C D-Flash number of program/erase cycles (-40°C ≤ tj ≤ 150°C)
does not exceed 85°C in a typical temperature profile over the lifetime of a consumer, industrial or automotive
does not exceed 85°C in a typical temperature profile over the lifetime of a consumer, industrial or automotive
85°C
85°C
(-40°C ≤ tj ≤ 150°C)
85°C
85°C
85°C
1
3
3
3
3
after up to 10,000 program/erase cycles
after less than 100 program/erase cycles
after up to 50,000 program/erase cycles
after less than 10,000 program/erase cycles
after less than 100 program/erase cycles
Table A-4
unless otherwise noted
Table A-19. NVM Reliability Characteristics
S12XS Family Reference Manual, Rev. 1.11
Rating
D-Flash Array
P-Flash Array
Javg
Javg
Javg
Javg
Javg
=
=
=
=
=
t
t
t
t
t
Symbol
PNVMRET
PNVMRET
DNVMRET
DNVMRET
DNVMRET
n
n
PFLPE
DFLPE
Min
10K
50K
15
20
10
20
5
100K
500K
100
100
100
100
100
Typ
Freescale Semiconductor
2
2
2
2
2
3
3
Max
—
—
—
—
—
—
—
Cycles
Cycles
Years
Years
Years
Years
Years
Unit