PNX1302EH NXP Semiconductors, PNX1302EH Datasheet - Page 48

• Manufacturer Part Number: PNX1302EH
• Manufacturer: NXP Semiconductors

Specifications of PNX1302EH

• Lead Free Status / RoHS Status: Not Compliant

PNX1300/01/02/11 Data Book
1-22
Figure 1-1. STRG3, STRG5 test load circuit
Figure 1-2. NORM3 test load circuit
Figure 1-3. WEAK5 test load circuit
Output
Figure 1-4. PCI Output Timing Measurement Con-
ditions
Buffer
PNX1300
Output
Output
Buffer
Buffer
PNX1300
PNX1300
Tri-State
Output
Output
Output
Delay
Delay
CLK
pin
30-ohm
pin
pin
PRELIMINARY SPECIFICATION
V_test
T_fval
T_rval
2” true length
2” true length
2” true length
T_off
50-ohm
50-ohm
50-ohm
T_on
V_tfall
V_trise
rise/fall test point
rise/fall test point
rise/fall test point
V_th
V_tl
12 pF
30 pF
15 pF
Figure 1-5. PCI Input Timing Measurement Conditions
Figure 1-6. PCI T
Figure 1-7. PCI T
Figure 1-8. PCI T
Figure 1-9. JTAG Input Timing
TDI, TMS
Input
TCK
CLK
Output
Output
Output
Buffer
Buffer
Buffer
V_th
V_tl
V_test
val
val
val
pin
pin
pin
(max) Rising Edge
(max) Falling Edge
(min) and Slew Rate
1K Ω
T
25 Ω
10 pF
su_TCK
T_su
inputs
valid
Philips Semiconductors
valid
T_h
V_test
1/2 in. max
10 pF
25 Ω
10 pF
1/2 in. max
1/2 in. max
T
V_test
h_TCK
Vcc
1K Ω
V_max
V_th
V_tl
Vcc