MC9S12C128VFU Freescale Semiconductor, MC9S12C128VFU Datasheet - Page 672

MC9S12C128VFU

Manufacturer Part Number
MC9S12C128VFU
Description
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MC9S12C128VFU

Cpu Family
HCS12
Device Core Size
16b
Frequency (max)
25MHz
Interface Type
CAN/SCI/SPI
Program Memory Type
Flash
Program Memory Size
128KB
Total Internal Ram Size
4KB
# I/os (max)
60
Number Of Timers - General Purpose
8
Operating Supply Voltage (typ)
2.5/5V
Operating Supply Voltage (max)
2.75/5.5V
Operating Supply Voltage (min)
2.35/2.97V
On-chip Adc
8-chx10-bit
Instruction Set Architecture
CISC
Operating Temp Range
-40C to 105C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
80
Package Type
PQFP
Lead Free Status / Rohs Status
Not Compliant

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Appendix A Electrical Characteristics
A.5.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures. The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed.
1. T
2. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to
3. Spec table quotes typical endurance evaluated at 25°C for this product family, typical endurance at various temperature can
672
Conditions are shown in Table A-4. unless otherwise noted
Num C
application.
25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please refer
to Engineering Bulletin EB618.
be estimated using the graph below. For additional information on how Freescale defines Typical Endurance, please refer to
Engineering Bulletin EB619.
1
2
3
4
Javg
will not exeed 85°C considering a typical temperature profile over the lifetime of a consumer, industrial or automotive
C Data retention after 10,000 program/erase cycles at an
C Data retention with <100 program/erase cycles at an
C Number of program/erase cycles
C Number of program/erase cycles
average junction temperature of T
average junction temperature T
(–40°C
(0°C
NVM Reliability
T
J
T
J
140°C)
0°C)
Table A-19. NVM Reliability Characteristics
Rating
Javg
MC9S12C-Family / MC9S12GC-Family
Javg
Flash Reliability Characteristics
85°C
85°C
Rev 01.24
Symbol
t
FLRET
n
FL
10,000
10,000
Min
15
20
(1)
100,000
100
100
Typ
(2)
2
Freescale Semiconductor
(3)
Max
Cycles
Years
Unit

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