EP2AGX65DF29C6N Altera, EP2AGX65DF29C6N Datasheet - Page 295

• Manufacturer Part Number: EP2AGX65DF29C6N
• Description: IC ARRIA II GX FPGA 65K 780FBGA
• Manufacturer: Altera
• Series: Arria II GXr

Specifications of EP2AGX65DF29C6N

• Number Of Logic Elements/cells: 60214
• Number Of Labs/clbs: 2530
• Total Ram Bits: 5246
• Number Of I /o: 364
• Voltage - Supply: 0.87 V ~ 0.93 V
• Mounting Type: Surface Mount
• Operating Temperature: 0°C ~ 85°C
• Package / Case: 780-FBGA
• Family Name: Arria® II GX
• Number Of Logic Blocks/elements: 63250
• # I/os (max): 364
• Frequency (max): 400MHz
• Operating Supply Voltage (typ): 900mV
• Logic Cells: 63250
• Ram Bits: 5557452.8
• Operating Supply Voltage (min): 0.87V
• Operating Supply Voltage (max): 0.93V
• Operating Temp Range: 0C to 85C
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 780
• Package Type: FC-FBGA
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Number Of Gates: -
• Lead Free Status / Rohs Status: Compliant

© July 2010
AIIGX51011-3.0
Altera Corporation
f
This chapter describes the boundary-scan test (BST) features that are supported in
Arria
document.
This chapter includes the following sections:
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Arria II GX devices support IEEE Std. 1149.1 and IEEE Std. 1149.6. The IEEE Std.
1149.6 is only supported on the high-speed serial interface (HSSI) transceivers in
Arria II GX devices. The IEEE Std. 1149.6 enables board-level connectivity checking
between transmitters and receivers that are AC coupled (connected with a capacitor
in series between the source and destination).
For information about the following topics, refer to the
Boundary-Scan Testing for Arria GX Devices
“IEEE Std. 1149.6 Boundary-Scan Register”
“BST Operation Control” on page 11–3
“I/O Voltage Support in a JTAG Chain” on page 11–5
“Boundary-Scan Description Language Support” on page 11–6
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®
IEEE Std. 1149.1 BST architecture and circuitry
TAP controller state-machine
IEEE Std. 1149.1 JTAG instructions
JTAG instructions code with descriptions
IEEE Std. 1149.1 BST guidelines
II GX devices. The features are similar to Arria GX devices, unless stated in this
11. JTAG Boundary-Scan Testing
chapter:
IEEE 1149.1 (JTAG)
Arria II GX Device Handbook, Volume 1