DS3141+ Maxim Integrated Products, DS3141+ Datasheet - Page 71

IC FRAMER DS3/E3 SNGL 144CSBGA

DS3141+

Manufacturer Part Number
DS3141+
Description
IC FRAMER DS3/E3 SNGL 144CSBGA
Manufacturer
Maxim Integrated Products
Datasheet

Specifications of DS3141+

Controller Type
DS3/E3 Framer
Interface
LIU
Voltage - Supply
3.135 V ~ 3.465 V
Current - Supply
80mA
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
144-CSBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Exit2-DR. While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state
and terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the Shift-DR
state.
Update-DR. A falling edge on JTCLK while in the Update-DR state latches the data from the shift register path of
the test registers into the data output latches. This prevents changes at the parallel output because of changes in
the shift register. A rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state. With JTMS
high, the controller enters the Select-DR-Scan state.
Select-IR-Scan. All test registers retain their previous state. The instruction register remains unchanged during this
state. With JTMS low, a rising edge on JTCLK moves the controller into the Capture-IR state and initiates a scan
sequence for the instruction register. JTMS high during a rising edge on JTCLK puts the controller back into the
Test-Logic-Reset state.
Capture-IR. The Capture-IR state is used to load the shift register in the instruction register with a fixed value. This
value is loaded on the rising edge of JTCLK. If JTMS is high on the rising edge of JTCLK, the controller enters the
Exit1-IR state. If JTMS is low on the rising edge of JTCLK, the controller enters the Shift-IR state.
Shift-IR. In this state, the shift register in the instruction register is connected between JTDI and JTDO and shifts
data one stage for every rising edge of JTCLK toward the serial output. The parallel register and all test registers
remain at their previous states. A rising edge on JTCLK with JTMS high moves the controller to the Exit1-IR state.
A rising edge on JTCLK with JTMS low keeps the controller in the Shift-IR state while moving data one stage
through the instruction shift register.
Exit1-IR. A rising edge on JTCLK with JTMS low puts the controller in the Pause-IR state. If JTMS is high on the
rising edge of JTCLK, the controller enters the Update-IR state and terminates the scanning process.
Pause-IR. Shifting of the instruction register is halted temporarily. With JTMS high, a rising edge on JTCLK puts
the controller in the Exit2-IR state. The controller remains in the Pause-IR state if JTMS is low during a rising edge
on JTCLK.
Exit2-IR. A rising edge on JTCLK with JTMS high puts the controller in the Update-IR state. The controller loops
back to the Shift-IR state if JTMS is low during a rising edge of JTCLK in this state.
Update-IR. The instruction shifted into the instruction shift register is latched into the parallel output on the falling
edge of JTCLK as the controller enters this state. Once latched, this instruction becomes the current instruction. A
rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state. With JTMS high, the controller
enters the Select-DR-Scan state.
9.2 JTAG Instruction Register and Instructions
The instruction register contains a shift register as well as a latched parallel output and is 3 bits in length. When the
TAP controller enters the Shift-IR state, the instruction shift register is connected between JTDI and JTDO. While in
the Shift-IR state, a rising edge on JTCLK with JTMS low shifts data one stage toward the serial output at JTDO. A
rising edge on JTCLK in the Exit1-IR state or the Exit2-IR state with JTMS high moves the controller to the Update-
IR state. The falling edge of that same JTCLK latches the data in the instruction shift register to the instruction
parallel output.
codes.
Table 9-A. JTAG Instruction Codes
SAMPLE/PRELOAD
INSTRUCTIONS
BYPASS
EXTEST
IDCODE
CLAMP
HIGHZ
Table 9-A
shows the instructions supported by the device and their respective operational binary
SELECTED REGISTER
Device Identification
Boundary Scan
Boundary Scan
Bypass
Bypass
Bypass
71 of 88
INSTRUCTION CODES
010
111
000
011
100
001

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