AT32UC3L-EK Atmel, AT32UC3L-EK Datasheet - Page 754

• Manufacturer Part Number: AT32UC3L-EK
• Description: KIT EVAL AVR32 UC3 MCU
• Manufacturer: Atmel
• Type: MCUr

Specifications of AT32UC3L-EK

• Contents: *
• Silicon Manufacturer: Atmel
• Core Architecture: AVR
• Core Sub-architecture: UC3L
• Kit Contents: Board
• Features: USB / Battery Powered, Board Controller / Bootloader
• Svhc: No SVHC (15-Dec-2010)
• Rohs Compliant: Yes
• Tool Type: Starter Kit
• Cpu Core: AVR 8
• Data Bus Width: 8 bit
• Processor Series: AT32
• Processor To Be Evaluated: AT32UC3L064
• Interface Type: USB, Capacitive Touch
• For Use With/related Products: *
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

31.5.3.2
32099F–11/2010
MEMORY_SERVICE
Starting in Run-Test/Idle, OCD registers are accessed in the following way:
For any operation, the full 7 bits of the address must be provided. For write operations, 32 data
bits must be provided, or the result will be undefined. For read operations, shifting may be termi-
nated once the required number of bits have been acquired.
Table 31-18. NEXUS_ACCESS Details
This instruction allows access to registers in an optional Memory Service Unit. The 7-bit register
index, a read/write control bit, and the 32-bit data is accessed through the JTAG port.
The data register is alternately interpreted by the SAB as an address register and a data regis-
ter. The SAB starts in address mode after the MEMORY_SERVICE instruction is selected, and
toggles between address and data mode each time a data scan completes with the busy bit
cleared.
Starting in Run-Test/Idle, Memory Service registers are accessed in the following way:
Instructions
IR input value
IR output value
DR Size
DR input value (Address phase)
DR input value (Data read phase)
DR input value (Data write phase)
DR output value (Address phase)
DR output value (Data read phase)
DR output value (Data write phase)
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Shift-DR: Scan in the direction bit (1=read, 0=write) and the 7-bit address for the
7. Go to Update-DR and re-enter Select-DR Scan.
8. In Shift-DR: For a read operation, scan out the contents of the addressed register. For a
9. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Shift-DR: Scan in the direction bit (1=read, 0=write) and the 7-bit address for the
OCD register.
write operation, scan in the new contents of the register.
Memory Service register.
Details
10000 (0x10)
peb01
34 bits
aaaaaaar xxxxxxxx xxxxxxxx xxxxxxxx xx
xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxxx xx
dddddddd dddddddd dddddddd dddddddd xx
xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
eb dddddddd dddddddd dddddddd dddddddd
xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
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