AT32UC3L-EK Atmel, AT32UC3L-EK Datasheet - Page 752

• Manufacturer Part Number: AT32UC3L-EK
• Description: KIT EVAL AVR32 UC3 MCU
• Manufacturer: Atmel
• Type: MCUr

Specifications of AT32UC3L-EK

• Contents: *
• Silicon Manufacturer: Atmel
• Core Architecture: AVR
• Core Sub-architecture: UC3L
• Kit Contents: Board
• Features: USB / Battery Powered, Board Controller / Bootloader
• Svhc: No SVHC (15-Dec-2010)
• Rohs Compliant: Yes
• Tool Type: Starter Kit
• Cpu Core: AVR 8
• Data Bus Width: 8 bit
• Processor Series: AT32
• Processor To Be Evaluated: AT32UC3L064
• Interface Type: USB, Capacitive Touch
• For Use With/related Products: *
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

31.5.2.4
31.5.2.5
32099F–11/2010
INTEST
CLAMP
This instruction selects the boundary-scan chain as Data Register for testing internal logic in the
device. The logic inputs are determined by the boundary-scan chain, and the logic outputs are
captured by the boundary-scan chain. The device output pins are driven from the boundary-scan
chain.
Starting in Run-Test/Idle, the INTEST instruction is accessed the following way:
Table 31-15. INTEST Details
This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the internal logic
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the internal logic is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the boundary-scan chain is applied to internal logic
10. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
inputs.
inputs.
Details
00100 (0x04)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
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