AT32UC3L-EK Atmel, AT32UC3L-EK Datasheet - Page 750

• Manufacturer Part Number: AT32UC3L-EK
• Description: KIT EVAL AVR32 UC3 MCU
• Manufacturer: Atmel
• Type: MCUr

Specifications of AT32UC3L-EK

• Contents: *
• Silicon Manufacturer: Atmel
• Core Architecture: AVR
• Core Sub-architecture: UC3L
• Kit Contents: Board
• Features: USB / Battery Powered, Board Controller / Bootloader
• Svhc: No SVHC (15-Dec-2010)
• Rohs Compliant: Yes
• Tool Type: Starter Kit
• Cpu Core: AVR 8
• Data Bus Width: 8 bit
• Processor Series: AT32
• Processor To Be Evaluated: AT32UC3L064
• Interface Type: USB, Capacitive Touch
• For Use With/related Products: *
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

31.5.2
31.5.2.1
31.5.2.2
32099F–11/2010
Public JTAG Instructions
IDCODE
SAMPLE_PRELOAD
Table 31-11. Instruction Description (Continued)
The JTAG standard defines a number of public JTAG instructions. These instructions are
described in the sections below.
This instruction selects the 32 bit Device Identification register (DID) as Data Register. The DID
register consists of a version number, a device number, and the manufacturer code chosen by
JEDEC. This is the default instruction after a JTAG reset. Details about the DID register can be
found in the module configuration section at the end of this chapter.
Starting in Run-Test/Idle, the Device Identification register is accessed in the following way:
Table 31-12. IDCODE Details
This instruction takes a snap-shot of the input/output pins without affecting the system operation,
and pre-loading the scan chain without updating the DR-latch. The boundary-scan chain is
selected as Data Register.
Starting in Run-Test/Idle, the Device Identification register is accessed in the following way:
Instruction
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The IDCODE value is latched into the shift register.
7. In Shift-DR: The IDCODE scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
Description
Shows the number of bits in the data register chain when this instruction is active.
Example: 34 bits
Shows which bit pattern to shift into the data register in the Shift-DR state when this
instruction is active. Multiple such lines may exist, e.g., to distinguish between
reads and writes.
Example: aaaaaaar xxxxxxxx xxxxxxxx xxxxxxxx xx
Shows the bit pattern shifted out of the data register in the Shift-DR state when this
instruction is active. Multiple such lines may exist, e.g., to distinguish between
reads and writes.
Example: xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
Details
00001 (0x01)
p0001
32
xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxxx
Device Identification Register
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