AT32UC3L-EK Atmel, AT32UC3L-EK Datasheet - Page 751
AT32UC3L-EK
Manufacturer Part Number
AT32UC3L-EK
Description
KIT EVAL AVR32 UC3 MCU
Manufacturer
Atmel
Type
MCUr
Specifications of AT32UC3L-EK
Contents
*
Silicon Manufacturer
Atmel
Core Architecture
AVR
Core Sub-architecture
UC3L
Kit Contents
Board
Features
USB / Battery Powered, Board Controller / Bootloader
Svhc
No SVHC (15-Dec-2010)
Rohs Compliant
Yes
Tool Type
Starter Kit
Cpu Core
AVR 8
Data Bus Width
8 bit
Processor Series
AT32
Processor To Be Evaluated
AT32UC3L064
Interface Type
USB, Capacitive Touch
For Use With/related Products
*
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AT32UC3L-EK
Manufacturer:
Atmel
Quantity:
135
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31.5.2.3
32099F–11/2010
EXTEST
Table 31-13. SAMPLE_PRELOAD Details
This instruction selects the boundary-scan chain as Data Register for testing circuitry external to
the 32-bit AVR package. The contents of the latched outputs of the boundary-scan chain is
driven out as soon as the JTAG IR-register is loaded with the EXTEST instruction.
Starting in Run-Test/Idle, the EXTEST instruction is accessed the following way:
Table 31-14. EXTEST Details
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The Data on the external pins are sampled into the boundary-scan
7. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the external pins is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the scan chain is applied to the output pins.
10. Return to Run-Test/Idle.
chain.
Details
00010 (0x02)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Details
00011 (0x03)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
AT32UC3L016/32/64
751
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