AT32UC3L-EK Atmel, AT32UC3L-EK Datasheet - Page 753

• Manufacturer Part Number: AT32UC3L-EK
• Description: KIT EVAL AVR32 UC3 MCU
• Manufacturer: Atmel
• Type: MCUr

Specifications of AT32UC3L-EK

• Contents: *
• Silicon Manufacturer: Atmel
• Core Architecture: AVR
• Core Sub-architecture: UC3L
• Kit Contents: Board
• Features: USB / Battery Powered, Board Controller / Bootloader
• Svhc: No SVHC (15-Dec-2010)
• Rohs Compliant: Yes
• Tool Type: Starter Kit
• Cpu Core: AVR 8
• Data Bus Width: 8 bit
• Processor Series: AT32
• Processor To Be Evaluated: AT32UC3L064
• Interface Type: USB, Capacitive Touch
• For Use With/related Products: *
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

31.5.2.6
31.5.3
31.5.3.1
32099F–11/2010
Private JTAG Instructions
NEXUS_ACCESS
BYPASS
Table 31-16. CLAMP Details
This instruction selects the 1-bit Bypass Register as Data Register.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
Table 31-17. BYPASS Details
The 32-bit AVR defines a number of private JTAG instructions, not defined by the JTAG stan-
dard. Each instruction is briefly described in text, with details following in table form.
This instruction allows Nexus-compliant access to the On-Chip Debug registers through the
SAB. The 7-bit register index, a read/write control bit, and the 32-bit data is accessed through
the JTAG port.
The data register is alternately interpreted by the SAB as an address register and a data regis-
ter. The SAB starts in address mode after the NEXUS_ACCESS instruction is selected, and
toggles between address and data mode each time a data scan completes with the busy bit
cleared.
NOTE: The polarity of the direction bit is inverse of the Nexus standard.
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
9. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
7. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
8. Return to Run-Test/Idle.
Details
00110 (0x06)
p0001
1
x
x
Details
11111 (0x1F)
p0001
1
x
x
AT32UC3L016/32/64
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