AT91CAP7E-NA-ZJ Atmel, AT91CAP7E-NA-ZJ Datasheet - Page 61

MCU CAP7 FPGA 225LFBGA

AT91CAP7E-NA-ZJ

Manufacturer Part Number
AT91CAP7E-NA-ZJ
Description
MCU CAP7 FPGA 225LFBGA
Manufacturer
Atmel
Series
CAP™r
Datasheets

Specifications of AT91CAP7E-NA-ZJ

Core Processor
ARM7
Core Size
16/32-Bit
Speed
80MHz
Connectivity
EBI/EMI, FPGA, IrDA, SPI, UART/USART, USB
Peripherals
DMA, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
256KB (256K x 8)
Program Memory Type
ROM
Ram Size
160K x 8
Voltage - Supply (vcc/vdd)
1.08 V ~ 1.32 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
225-LFBGA
Processor Series
AT91Mx
Core
ARM7TDMI
Data Bus Width
32 bit
3rd Party Development Tools
JTRACE-ARM-2M, MDK-ARM, RL-ARM, ULINK2
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT91CAP7E-NA-ZJ
Manufacturer:
Atmel
Quantity:
10 000
13. CAP7E Debug and Test
13.1
13.2
Figure 13-1. Debug and Test Block Diagram
8549A–CAP–10/08
Overview
Block Diagram
TAP: Test Access Port
ARM7TDMI
The AT91CAP7E features a number of complementary debug and test capabilities. A common
JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as down-
loading code and single-stepping through programs. The Debug Unit provides a two-pin UART
that can be used to upload an application into internal SRAM. It manages the interrupt handling
of the internal COMMTX and COMMRX signals that trace the activity of the Debug Communica-
tion Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Boundary
Port
ICE
DBGU
ICE/JTAG
TAP
Reset
Test
and
POR
TMS
TCK
TDI
JTAGSEL
TDO
DTXD
DRXD
RTCK
TST
NTRST
AT91CAP7E
61

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