AT91SAM7XC512-CU Atmel, AT91SAM7XC512-CU Datasheet - Page 51

• Manufacturer Part Number: AT91SAM7XC512-CU
• Description: MCU ARM 512K HS FLASH 100-TFBGA
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM7XC512-CU

• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 55MHz
• Connectivity: CAN, Ethernet, I²C, SPI, SSC, UART/USART, USB
• Peripherals: Brown-out Detect/Reset, DMA, POR, PWM, WDT
• Number Of I /o: 62
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Ram Size: 128K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-TFBGA
• Processor Series: AT91SAMx
• Core: ARM7TDMI
• Data Bus Width: 32 bit
• Data Ram Size: 128 KB
• Interface Type: MII, SPI, TWI
• Maximum Clock Frequency: 55 MHz
• Number Of Programmable I/os: 62
• Number Of Timers: 3
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: JTRACE-ARM-2M, KSK-AT91SAM7X-PL, MDK-ARM, RL-ARM, ULINK2
• Development Tools By Supplier: AT91SAM-ICE, AT91-ISP, AT91SAM7XC-EK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 8 Channel
• For Use With: AT91SAM-ICE - EMULATOR FOR AT91 ARM7/ARM9AT91SAM7XC-EK - KIT EVAL FOR AT91SAM7XC256/128
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

12.3.2
12.4
6209F–ATARM–17-Feb-09
Debug and Test Pin Description
Test Environment
Figure 12-3
ter. In this example, the “board in test” is designed using a number of JTAG-compliant devices.
These devices can be connected to form a single scan chain.
Figure 12-3. Application Test Environment Example
Table 12-1.
Pin Name
NRST
TST
TCK
TDI
TDO
TMS
JTAGSEL
DRXD
DTXD
shows a test environment example. Test vectors are sent and interpreted by the tes-
Debug and Test Pin List
AT91SAM7XC512/256/128 Preliminary
AT91SAM7XCxx-based Application Board In Test
Connector
ICE/JTAG
Function
Microcontroller Reset
Test Mode Select
Test Clock
Test Data In
Test Data Out
Test Mode Select
JTAG Selection
Debug Receive Data
Debug Transmit Data
AT91SAM7XCxx
Interface
JTAG
ICE and JTAG
Chip n
Debug Unit
Reset/Test
Test Adaptor
Chip 2
Chip 1
Input/Output
Output
Output
Type
Input
Input
Input
Input
Input
Input
Tester
Active Level
High
Low
51