ATMEGA16-16PU Atmel, ATMEGA16-16PU Datasheet - Page 225

• Manufacturer Part Number: ATMEGA16-16PU
• Description: IC AVR MCU 16K 16MHZ 5V 40DIP
• Manufacturer: Atmel
• Series: AVR® ATmegar

Specifications of ATMEGA16-16PU

• Core Processor: AVR
• Core Size: 8-Bit
• Speed: 16MHz
• Connectivity: I²C, SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, POR, PWM, WDT
• Number Of I /o: 32
• Program Memory Size: 16KB (8K x 16)
• Program Memory Type: FLASH
• Eeprom Size: 512 x 8
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 4.5 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 40-DIP (0.600", 15.24mm)
• Package: 40PDIP
• Device Core: AVR
• Family Name: ATmega
• Maximum Speed: 16 MHz
• Operating Supply Voltage: 5 V
• Data Bus Width: 8 Bit
• Number Of Programmable I/os: 32
• Interface Type: TWI/SPI/USART
• On-chip Adc: 8-chx10-bit
• Number Of Timers: 3
• Processor Series: ATMEGA16x
• Core: AVR8
• Data Ram Size: 1 KB
• Maximum Clock Frequency: 16 MHz
• Maximum Operating Temperature: + 85 C
• Mounting Style: Through Hole
• 3rd Party Development Tools: EWAVR, EWAVR-BL
• Development Tools By Supplier: ATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATAVRONEKIT
• Minimum Operating Temperature: - 40 C
• A/d Inputs: 8-Channel, 10-Bit
• Cpu Speed: 16 MIPS
• Eeprom Memory: 512 Bytes
• Input Output: 32
• Interface: JTAG/SPI/UART
• Memory Type: Flash
• Number Of Bits: 8
• Package Type: 44-pin PDIP
• Programmable Memory: 16K Bytes
• Timers: 2-8-bit, 1-16-bit
• Voltage, Range: 4.5-5.5 V
• Controller Family/series: AVR MEGA
• No. Of I/o's: 32
• Eeprom Memory Size: 512Byte
• Ram Memory Size: 1KB
• Rohs Compliant: Yes
• For Use With: ATSTK600-TQFP44 - STK600 SOCKET/ADAPTER 44-TQFPATSTK600-DIP40 - STK600 SOCKET/ADAPTER 40-PDIP770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAGATAVRISP2 - PROGRAMMER AVR IN SYSTEMATJTAGICE2 - AVR ON-CHIP D-BUG SYSTEMATSTK500 - PROGRAMMER AVR STARTER KIT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

On-chip Debug Related
Register in I/O Memory
On-chip Debug Register –
OCDR
Using the JTAG
Programming
Capabilities
Bibliography
2466J–AVR–10/04
The OCDR Register provides a communication channel from the running program in the
microcontroller to the debugger. The CPU can transfer a byte to the debugger by writing
to this location. At the same time, an Internal Flag; I/O Debug Register Dirty – IDRD – is
set to indicate to the debugger that the register has been written. When the CPU reads
the OCDR Register the 7 LSB will be from the OCDR Register, while the MSB is the
IDRD bit. The debugger clears the IDRD bit when it has read the information.
In some AVR devices, this register is shared with a standard I/O location. In this case,
the OCDR Register can only be accessed if the OCDEN Fuse is programmed, and the
debugger enables access to the OCDR Register. In all other cases, the standard I/O
location is accessed.
Refer to the debugger documentation for further information on how to use this register.
Programming of AVR parts via JTAG is performed via the 4-pin JTAG port, TCK, TMS,
TDI and TDO. These are the only pins that need to be controlled/observed to perform
JTAG programming (in addition to power pins). It is not required to apply 12V externally.
The JTAGEN Fuse must be programmed and the JTD bit in the MCUSR Register must
be cleared to enable the JTAG Test Access Port.
The JTAG programming capability supports:
•
•
•
•
The Lock bit security is exactly as in Parallel Programming mode. If the Lock bits LB1 or
LB2 are programmed, the OCDEN Fuse cannot be programmed unless first doing a
chip erase. This is a security feature that ensures no back-door exists for reading out the
content of a secured device.
The details on programming through the JTAG interface and programming specific
JTAG instructions are given in the section “Programming via the JTAG Interface” on
page 278.
For more information about general Boundary-scan, the following literature can be
consulted:
•
•
Bit
Read/Write
Initial Value
Flash programming and verifying
EEPROM programming and verifying
Fuse programming and verifying
Lock bit programming and verifying
IEEE: IEEE Std. 1149.1-1990. IEEE Standard Test Access Port and Boundary-scan
Architecture, IEEE, 1993
Colin Maunder: The Board Designers Guide to Testable Logic Circuits, Addison-
Wesley, 1992
MSB/IDRD
R/W
7
0
R/W
6
0
R/W
5
0
R/W
4
0
R/W
3
0
R/W
2
0
ATmega16(L)
R/W
1
0
LSB
R/W
0
0
OCDR
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