ATMEGA16-16PU Atmel, ATMEGA16-16PU Datasheet - Page 223

• Manufacturer Part Number: ATMEGA16-16PU
• Description: IC AVR MCU 16K 16MHZ 5V 40DIP
• Manufacturer: Atmel
• Series: AVR® ATmegar

Specifications of ATMEGA16-16PU

• Core Processor: AVR
• Core Size: 8-Bit
• Speed: 16MHz
• Connectivity: I²C, SPI, UART/USART
• Peripherals: Brown-out Detect/Reset, POR, PWM, WDT
• Number Of I /o: 32
• Program Memory Size: 16KB (8K x 16)
• Program Memory Type: FLASH
• Eeprom Size: 512 x 8
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 4.5 V ~ 5.5 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 40-DIP (0.600", 15.24mm)
• Package: 40PDIP
• Device Core: AVR
• Family Name: ATmega
• Maximum Speed: 16 MHz
• Operating Supply Voltage: 5 V
• Data Bus Width: 8 Bit
• Number Of Programmable I/os: 32
• Interface Type: TWI/SPI/USART
• On-chip Adc: 8-chx10-bit
• Number Of Timers: 3
• Processor Series: ATMEGA16x
• Core: AVR8
• Data Ram Size: 1 KB
• Maximum Clock Frequency: 16 MHz
• Maximum Operating Temperature: + 85 C
• Mounting Style: Through Hole
• 3rd Party Development Tools: EWAVR, EWAVR-BL
• Development Tools By Supplier: ATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATAVRONEKIT
• Minimum Operating Temperature: - 40 C
• A/d Inputs: 8-Channel, 10-Bit
• Cpu Speed: 16 MIPS
• Eeprom Memory: 512 Bytes
• Input Output: 32
• Interface: JTAG/SPI/UART
• Memory Type: Flash
• Number Of Bits: 8
• Package Type: 44-pin PDIP
• Programmable Memory: 16K Bytes
• Timers: 2-8-bit, 1-16-bit
• Voltage, Range: 4.5-5.5 V
• Controller Family/series: AVR MEGA
• No. Of I/o's: 32
• Eeprom Memory Size: 512Byte
• Ram Memory Size: 1KB
• Rohs Compliant: Yes
• For Use With: ATSTK600-TQFP44 - STK600 SOCKET/ADAPTER 44-TQFPATSTK600-DIP40 - STK600 SOCKET/ADAPTER 40-PDIP770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAGATAVRISP2 - PROGRAMMER AVR IN SYSTEMATJTAGICE2 - AVR ON-CHIP D-BUG SYSTEMATSTK500 - PROGRAMMER AVR STARTER KIT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Using the Boundary-
scan Chain
Using the On-chip Debug
System
2466J–AVR–10/04
•
•
•
As shown in the state diagram, the Run-Test/Idle state need not be entered between
selecting JTAG instruction and using Data Registers, and some JTAG instructions may
select certain functions to be performed in the Run-Test/Idle, making it unsuitable as an
Idle state.
Note:
For detailed information on the JTAG specification, refer to the literature listed in “Bibli-
ography” on page 225.
A complete description of the Boundary-scan capabilities are given in the section “IEEE
1149.1 (JTAG) Boundary-scan” on page 226.
As shown in Figure 112, the hardware support for On-chip Debugging consists mainly
of:
•
•
•
All read or modify/write operations needed for implementing the Debugger are done by
applying AVR instructions via the internal AVR CPU Scan Chain. The CPU sends the
result to an I/O memory mapped location which is part of the communication interface
between the CPU and the JTAG system.
The Break Point Unit implements Break on Change of Program Flow, Single Step
Break, 2 Program Memory Break Points, and 2 combined Break Points. Together, the 4
Break Points can be configured as either:
•
•
•
this state is left by setting TMS high. While the instruction is shifted in from the TDI
pin, the captured IR-state 0x01 is shifted out on the TDO pin. The JTAG Instruction
selects a particular Data Register as path between TDI and TDO and controls the
circuitry surrounding the selected Data Register.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. The instruction
is latched onto the parallel output from the Shift Register path in the Update-IR
state. The Exit-IR, Pause-IR, and Exit2-IR states are only used for navigating the
state machine.
At the TMS input, apply the sequence 1, 0, 0 at the rising edges of TCK to enter the
Shift Data Register – Shift-DR state. While in this state, upload the selected Data
Register (selected by the present JTAG instruction in the JTAG Instruction Register)
from the TDI input at the rising edge of TCK. In order to remain in the Shift-DR state,
the TMS input must be held low during input of all bits except the MSB. The MSB of
the data is shifted in when this state is left by setting TMS high. While the Data
Register is shifted in from the TDI pin, the parallel inputs to the Data Register
captured in the Capture-DR state is shifted out on the TDO pin.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. If the selected
Data Register has a latched parallel-output, the latching takes place in the Update-
DR state. The Exit-DR, Pause-DR, and Exit2-DR states are only used for navigating
the state machine.
A scan chain on the interface between the internal AVR CPU and the internal
peripheral units
Break Point unit
Communication interface between the CPU and JTAG system
4 single Program Memory Break Points
3 Single Program Memory Break Point + 1 single Data Memory Break Point
2 single Program Memory Break Points + 2 single Data Memory Break Points
Independent of the initial state of the TAP Controller, the Test-Logic-Reset state can
always be entered by holding TMS high for five TCK clock periods.
ATmega16(L)
223