s3c4510b Samsung Semiconductor, Inc., s3c4510b Datasheet - Page 399

• Manufacturer Part Number: s3c4510b
• Description: 16/32-bit Risc Microcontroller
• Manufacturer: Samsung Semiconductor, Inc.

S3C4510B
APPENDIX A
APPENDIX A
TEST ACCESS PORT
This section describes relevant sections of the IEEE Standard 1149.1 Compatible Test Access Port (TAP). This
standard applies to the Test Access Port and Boundary Scan (JTAG) specification, which is supported by the
S3C4510B microcontoller.
In test mode, package pads are monitored by the serial scan circuitry. This is done to support connectivity testing
during manufacturing, as well as system diagnostics. JTAG control is not used to drive internal data out of the
S3C4510B.
To conform with IEEE 1194.1, the S3C4510B has a TAP controller, an instruction register, a bypass register, and
an ID register. These components are described in detail below.
A-1