LFDAS12XSDT Freescale Semiconductor, LFDAS12XSDT Datasheet - Page 684

• Manufacturer Part Number: LFDAS12XSDT
• Description: HARDWARE MC9S12XS 52-PIN
• Manufacturer: Freescale Semiconductor

Specifications of LFDAS12XSDT

• Module/board Type: *
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With/related Products: -

Electrical Characteristics
684
1
2
3
Conditions are shown in
Num C
T
application.
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618
T
application.
1
2
3
4
5
6
7
Javg
Javg
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C P-Flash number of program/erase cycles
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C Data retention at an average junction temperature of T
C D-Flash number of program/erase cycles (-40°C ≤ tj ≤ 150°C)
does not exceed 85°C in a typical temperature profile over the lifetime of a consumer, industrial or automotive
does not exceed 85°C in a typical temperature profile over the lifetime of a consumer, industrial or automotive
85°C
85°C
(-40°C ≤ tj ≤ 150°C)
85°C
85°C
85°C
1
3
3
3
3
after up to 10,000 program/erase cycles
after less than 100 program/erase cycles
after up to 50,000 program/erase cycles
after less than 10,000 program/erase cycles
after less than 100 program/erase cycles
Table A-4
unless otherwise noted
Table A-19. NVM Reliability Characteristics
S12XS Family Reference Manual, Rev. 1.11
Rating
D-Flash Array
P-Flash Array
Javg
Javg
Javg
Javg
Javg
=
=
=
=
=
t
t
t
t
t
Symbol
PNVMRET
PNVMRET
DNVMRET
DNVMRET
DNVMRET
n
n
PFLPE
DFLPE
Min
10K
50K
15
20
10
20
5
100K
500K
100
100
100
100
100
Typ
Freescale Semiconductor
2
2
2
2
2
3
3
Max
—
—
—
—
—
—
—
Cycles
Cycles
Years
Years
Years
Years
Years
Unit