SDA9410-B13 MICRONAS [Micronas], SDA9410-B13 Datasheet - Page 44

• Manufacturer Part Number: SDA9410-B13
• Description: Display Processor and Scan Rate Converter using Embedded DRAM Technology Units
• Manufacturer: MICRONAS [Micronas]

SDA9410
Table 25
5.4.4
The noise measurement algorithm can be used to change the I²C Bus parameters of the
temporal noise reduction processing depending on the actual noise level of the input
signal. This is done by the I²C Bus controller which reads the NOISEME value, and
sends depending on this value different I²C Bus parameter sets to the temporal noise
reduction registers of the SDA 9410. The NOISEME value can be interpreted as a linear
curve from no noise (0) to strong noise (30). Value 31 indicates an overflow status and
can be handled in different ways: strong noise or measurement failed.
Two measurement algorithms are included, which can be chosen by the I²C Bus
parameter NMALG. In case NMALG=1 the noise is measured during the vertical
blanking period in the line defined by NMLINE. For NMALG=0 the noise is measured
during the first active line. In the latter case the delay of the noise reduction algorithm
must be set to the frame difference value (DTNRON=0, I²C Bus sub address 1Ah). In
both cases the value is determined by averaging over several fields.
The Figure 18 shows an example for the noise measurement. The NMLINE I²C Bus
parameter determines the line, which is used in the SDA 9410 for the measurement. In
case of VINDEL=0 and NMLINE=0 line 3 of the field A and line 316 of the field B is
44
I²C Bus parameter
NRON
1: on
0: off
TNRSEL
1: separate
0: luminance
motion detector
DTNRON
1: field
0: frame
TNRFIY/C
1: off
0: on
TNRVAY/C
TNRHOY/C
TNRKOY/C
TNRCLY/C
Noise measurement
Input write I²C Bus parameter
Sub address
1Ah
18h
1Ah
18h/19h
17h
18h/19h
16h
15h
Description
Temporal Noise Reduction of Luminance and
Chrominance On (SRC-Mode)
Switch for motion detection of temporal noise
reduction of chrominance signal
Delay for temporal noise reduction of luminance and
chrominance signal
Switch for fixed K-factor value defined by TNRVAY/C
Fixed K-factor for temporal noise reduction of
luminance/chrominance
Horizontal shift of the motion detector characteristic
Vertical shift of the motion detector characteristic
Classification of temporal noise reduction
Input signal processing
Preliminary Data Sheet
Micronas