AT32UC3C0512CAU Atmel Corporation, AT32UC3C0512CAU Datasheet - Page 1216

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AT32UC3C0512CAU

Manufacturer Part Number
AT32UC3C0512CAU
Description
Manufacturer
Atmel Corporation

Specifications of AT32UC3C0512CAU

Flash (kbytes)
512 Kbytes
Pin Count
144
Max. Operating Frequency
66 MHz
Cpu
32-bit AVR
# Of Touch Channels
32
Hardware Qtouch Acquisition
No
Max I/o Pins
123
Ext Interrupts
144
Usb Transceiver
1
Quadrature Decoder Channels
2
Usb Speed
Full Speed
Usb Interface
Device + OTG
Spi
7
Twi (i2c)
3
Uart
5
Can
2
Lin
5
Ssc
1
Ethernet
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
16
Adc Resolution (bits)
12
Adc Speed (ksps)
2000
Analog Comparators
4
Resistive Touch Screen
No
Dac Channels
4
Dac Resolution (bits)
12
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
68
Self Program Memory
YES
External Bus Interface
1
Dram Memory
sdram
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
3.0 to 3.6 or 4.5 to 5.5
Operating Voltage (vcc)
3.0 to 3.6 or 4.5 to 5.5
Fpu
Yes
Mpu / Mmu
Yes / No
Timers
6
Output Compare Channels
22
Input Capture Channels
12
Pwm Channels
20
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT32UC3C0512CAU-ALUT
Manufacturer:
Atmel
Quantity:
10 000
39.5.2.4
39.5.2.5
32117C–AVR-08/11
INTEST
CLAMP
This instruction selects the boundary-scan chain as Data Register for testing internal logic in the
device. The logic inputs are determined by the boundary-scan chain, and the logic outputs are
captured by the boundary-scan chain. The device output pins are driven from the boundary-scan
chain.
Starting in Run-Test/Idle, the INTEST instruction is accessed the following way:
Table 39-13. INTEST Details
This instruction selects the Bypass register as Data Register. The device output pins are driven
from the boundary-scan chain.
Starting in Run-Test/Idle, the CLAMP instruction is accessed the following way:
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the internal logic
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: The data on the internal logic is sampled into the boundary-scan chain.
8. In Shift-DR: The boundary-scan chain is shifted by the TCK input.
9. In Update-DR: The data from the boundary-scan chain is applied to internal logic
10. Return to Run-Test/Idle.
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. In Update-IR: The data from the boundary-scan chain is applied to the output pins.
5. Return to Run-Test/Idle.
6. Select the DR Scan path.
7. In Capture-DR: A logic ‘0’ is loaded into the Bypass Register.
8. In Shift-DR: Data is scanned from TDI to TDO through the Bypass register.
inputs.
inputs.
Details
00100 (0x04)
p0001
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
Depending on boundary-scan chain, see BSDL-file.
AT32UC3C
1216

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