H27US08121B-TPCB HYNIX SEMICONDUCTOR, H27US08121B-TPCB Datasheet - Page 15

MEMORY, FLASH NAND 512MB, TSOP48

H27US08121B-TPCB

Manufacturer Part Number
H27US08121B-TPCB
Description
MEMORY, FLASH NAND 512MB, TSOP48
Manufacturer
HYNIX SEMICONDUCTOR
Datasheet

Specifications of H27US08121B-TPCB

Memory Size
512Mbit
Access Time
45ns
Supply Voltage Range
2.7V To 3.6V
Memory Case Style
TSOP
No. Of Pins
48
Operating Temperature Range
0°C To +70°C
Package / Case
TSOP
Base Number
27
Memory Type
Flash - NAND
Memory Configuration
64M X 8, 32M X 16
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
A9-A25(1)
A9-A25(1)
Note: 1. If t
Note: 1. Highest address depends on device density.
Rev 0.6 / Oct. 2004
A0-A7
A0-A7
RE
RB
CE
CLE
ALE
WE
I/O
ELWL
(1st half Page)
(1st half Page)
Command
01h/ 50h
Code
00h/
is less than 10ns, t
Read A Command, x8 Devices
Area A
Area A
Read B Command, x8 Devices
(2nd half
(2nd half
Address Input
Area B
Area B
Page)
Page)
WLWH
must be minimum 35ns, otherwise, t
Figure 10. Read (A, B, C) Operation
Figure 11. Read Block Diagrams
(Spare)
(Spare)
Area C
Area C
tBLBH1
(read)
512Mbit (64Mx8bit / 32Mx16bit) NAND Flash
Busy
A0-A2 (x16)
A9-A25(1)
A9-A25(1)
A0-A3 (x8)
A0-A7
WLWH
Data Output (sequentially)
HY27US(08/16)121M Series
HY27SS(08/16)121M Series
may be minimum 25ns.
Read A Command, x16 Devices
Area A
Read C Command, x8/x16 Devices
A4-A7 (x8), A3-A7 (x16) are don't care
(main area)
Area A
Area A/B
Area C
(Spare)
(50h)
Area C
15

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