S1K50000 Epson Electronics America, Inc., S1K50000 Datasheet - Page 82

• Manufacturer Part Number: S1K50000
• Description: Design Guide S1k50000 Series
• Manufacturer: Epson Electronics America, Inc.

STANDARD CELL S1K50000 SERIES
DESIGN GUIDE
(c) Input-current test
Measure the input-related parameters of an input buffer. This measurement item includes
measurement of the input leakage current and pull-up/pull-down currents. A test is
performed for this measurement item through application of the V
measured pin and measurement of the current flowing through that pin. This means that a
high or low voltage is applied to the measured pin during measurement. If this test is
performed by applying the V
measured pin changes state from low to high, which may cause the LSI to operate
unexpectedly.
For measurement during the input-current test, in an event of the test pattern in which the
measured pin input is driven high, apply the V
measured pin is held low, apply the V
these states for the measured pin, this test cannot be performed.
The input-current test is further classified into the following categories:
(1) All input pins are in a steady state.
(2) Bidirectional pins are driven high or low, or set for output.
(3) No operating parts such as an oscillator exist in the circuit.
(4) The internal tri-state buffer (internal bus) is not left floating or is not contending for
(5) RAM, ROM, and megacells are not conducting current.
(6) Input pins with pull-up resistors are pulled high.
(7) Bidirectional pins with pull-up resistors are pulled high or are outputting a high
(8) Bidirectional pins with pull-down resistors are set for input or are outputting a low
bus control.
signal.
signal.
DD
(high) voltage to the measured pin while it is held low, the
SS
EPSON
voltage to the pin. Unless the test pattern has
DD
voltage to the pin. In an event in which the
Chapter 6: Creating Test Patterns
DD
or V
SS
voltage to the
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